圆截面金属线对光电影响频率测量

Н.Д. Прасолов, А.И. Лихачев, Р. В. Соколов, Артем Андреевич Левин, М. В. Нарыкова, А. Г. Кадомцев, П.Н. Брунков, М. М. Султанов, А.В. Стрижиченко, И. А. Болдырев
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引用次数: 0

摘要

给出了在20Hz ~ 2MHz的宽频率范围内,对不同直径的圆形截面铝和铜导体的有源电阻频率相关性的测量结果。利用趋肤效应模拟,我们发现与理论值相比,在200 kHz以上的频率范围内,当趋肤层厚度小于200 μm时,所有类型的导线的主动电阻都增加了。这种现象可能与金属丝通过模具拉丝的制造过程有关,当在近表层形成缺陷时,导致其电阻率增加。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Измерения частотной зависимости скин-эффекта металлических проводов с круглым сечением
Presented results of active resistance frequency dependence measurements of a circular cross-section aluminum and copper conductors with a various diameter in a wide frequency range from 20Hz to 2MHz. Using the skin effect simulation we show that for all types of wires an increased active resistance observed, compared to the theoretical values in the frequency range above 200 kHz, where the skin layer thickness becomes less than 200 μm. This phenomenon may be associated with the manufacturing process of a metal wire by drawing through a die, when defects are formed in the near-surface layer, leading to its increased resistivity.
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