Н.Д. Прасолов, А.И. Лихачев, Р. В. Соколов, Артем Андреевич Левин, М. В. Нарыкова, А. Г. Кадомцев, П.Н. Брунков, М. М. Султанов, А.В. Стрижиченко, И. А. Болдырев
{"title":"圆截面金属线对光电影响频率测量","authors":"Н.Д. Прасолов, А.И. Лихачев, Р. В. Соколов, Артем Андреевич Левин, М. В. Нарыкова, А. Г. Кадомцев, П.Н. Брунков, М. М. Султанов, А.В. Стрижиченко, И. А. Болдырев","doi":"10.21883/jtf.2023.08.55982.288-22","DOIUrl":null,"url":null,"abstract":"Presented results of active resistance frequency dependence measurements of a circular cross-section aluminum and copper conductors with a various diameter in a wide frequency range from 20Hz to 2MHz. Using the skin effect simulation we show that for all types of wires an increased active resistance observed, compared to the theoretical values in the frequency range above 200 kHz, where the skin layer thickness becomes less than 200 μm. This phenomenon may be associated with the manufacturing process of a metal wire by drawing through a die, when defects are formed in the near-surface layer, leading to its increased resistivity.","PeriodicalId":24036,"journal":{"name":"Журнал технической физики","volume":"41 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Измерения частотной зависимости скин-эффекта металлических проводов с круглым сечением\",\"authors\":\"Н.Д. Прасолов, А.И. Лихачев, Р. В. Соколов, Артем Андреевич Левин, М. В. Нарыкова, А. Г. Кадомцев, П.Н. Брунков, М. М. Султанов, А.В. Стрижиченко, И. А. Болдырев\",\"doi\":\"10.21883/jtf.2023.08.55982.288-22\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Presented results of active resistance frequency dependence measurements of a circular cross-section aluminum and copper conductors with a various diameter in a wide frequency range from 20Hz to 2MHz. Using the skin effect simulation we show that for all types of wires an increased active resistance observed, compared to the theoretical values in the frequency range above 200 kHz, where the skin layer thickness becomes less than 200 μm. This phenomenon may be associated with the manufacturing process of a metal wire by drawing through a die, when defects are formed in the near-surface layer, leading to its increased resistivity.\",\"PeriodicalId\":24036,\"journal\":{\"name\":\"Журнал технической физики\",\"volume\":\"41 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Журнал технической физики\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.21883/jtf.2023.08.55982.288-22\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Журнал технической физики","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.21883/jtf.2023.08.55982.288-22","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Измерения частотной зависимости скин-эффекта металлических проводов с круглым сечением
Presented results of active resistance frequency dependence measurements of a circular cross-section aluminum and copper conductors with a various diameter in a wide frequency range from 20Hz to 2MHz. Using the skin effect simulation we show that for all types of wires an increased active resistance observed, compared to the theoretical values in the frequency range above 200 kHz, where the skin layer thickness becomes less than 200 μm. This phenomenon may be associated with the manufacturing process of a metal wire by drawing through a die, when defects are formed in the near-surface layer, leading to its increased resistivity.