{"title":"粗糙铜表面在太赫兹频率下的电阻增加","authors":"M. Kirley, J. Booske","doi":"10.1109/IVEC.2014.6857537","DOIUrl":null,"url":null,"abstract":"We find that the surface resistance of smooth copper exceeds that predicted by classical electromagnetic theory. We have fabricated copper surfaces with controlled roughness and grain size. We will present measurements of the reflectivity of these copper surfaces and compare these results to theoretical predictions for the THz resistance of surfaces.","PeriodicalId":88890,"journal":{"name":"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference","volume":"170 1","pages":"157-158"},"PeriodicalIF":0.0000,"publicationDate":"2014-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Increased resistance of rough copper surfaces at terahertz frequencies\",\"authors\":\"M. Kirley, J. Booske\",\"doi\":\"10.1109/IVEC.2014.6857537\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We find that the surface resistance of smooth copper exceeds that predicted by classical electromagnetic theory. We have fabricated copper surfaces with controlled roughness and grain size. We will present measurements of the reflectivity of these copper surfaces and compare these results to theoretical predictions for the THz resistance of surfaces.\",\"PeriodicalId\":88890,\"journal\":{\"name\":\"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference\",\"volume\":\"170 1\",\"pages\":\"157-158\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-04-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVEC.2014.6857537\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVEC.2014.6857537","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Increased resistance of rough copper surfaces at terahertz frequencies
We find that the surface resistance of smooth copper exceeds that predicted by classical electromagnetic theory. We have fabricated copper surfaces with controlled roughness and grain size. We will present measurements of the reflectivity of these copper surfaces and compare these results to theoretical predictions for the THz resistance of surfaces.