М. А. Путято, Евгений Александрович Емельянов, М. О. Петрушков, А.В. Васев, Б.Р. Cемягин, В. В. Преображенский
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引用次数: 0
摘要
用现象模型描述了As2和P2分子在GaAs(001)衬底上的分子束外延生长条件对GaPx As1−x固溶体磷比例的影响。该模型建立在关于iii−V化合物MBE生长的成熟思想的基础上。砷和磷原子掺入系数的比值是底物温度和分子通量密度的函数。经验表达式描述了砷磷掺入系数比随指示生长参数的变化规律。这使得在给定的衬底温度和镓原子流动密度下,可以估计V族分子通量值,以获得所需的xin a GaPx As1 - x固溶体。
Молекулярно-лучевая эпитаксия твердого раствора GaP-=SUB=-x-=/SUB=-As-=SUB=-1-x-=/SUB=-: феноменологическое описание зависимости x от условий роста на подложке GaAs(001)
The experimental dependences of the GaPx As1−x solid solution phosphorus proportion on growth conditions by molecular beam epitaxy from As2 and P2 molecules on GaAs(001) substrate were described using the phenomenological model. The model was built on the well-established ideas about the III−V compounds MBE growth. The ratio of the arsenic and phosphorus atoms incorporation coefficients was considered as a function of the substrate temperature and molecular flux densitys. Empirical expressions were found that describe the behavior of the arsenic and phosphorus incorporation coefficients ratio depending on the indicated growth parameters. This makes it possible to estimate the V group molecule flux values to obtain the required x in a GaPx As1−x solid solution at the given substrate temperature and the gallium atoms flow density.