{"title":"利用同步辐射特性的角分辨光谱学","authors":"K. Horiba, Hiroshi Umigashira","doi":"10.1380/JSSSJ.38.553","DOIUrl":null,"url":null,"abstract":"Angle-resolved photoemission spectroscopy (ARPES) is a powerful experimental tool for revealing the electronic band structure of solids. Excellent characteristics of synchrotron radiation light enable us to achieve specialized ARPES measurements. In order to perform such experiments, we have constructed a new beamline BL-2 MUSASHI (Multiple Undulator beamline for Spectroscopic Analysis of Surface and Hetero-Interface) at Photon Factory, KEK. As examples of the specialized ARPES measurements by utilizing the advantage of this beamline, we introduce recent ARPES results on ( 1 ) three-dimensional electronic structures with changing the photon energy, ( 2 ) bulk electronic structures using high energy soft x rays, and ( 3 ) orbital-selective electronic structures by polarization dependent ARPES measurements.","PeriodicalId":13075,"journal":{"name":"Hyomen Kagaku","volume":"202 1","pages":"553-558"},"PeriodicalIF":0.0000,"publicationDate":"2017-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Angle-Resolved Photoemission Spectroscopy Utilizing Characteristics of Synchrotron Radiation\",\"authors\":\"K. Horiba, Hiroshi Umigashira\",\"doi\":\"10.1380/JSSSJ.38.553\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Angle-resolved photoemission spectroscopy (ARPES) is a powerful experimental tool for revealing the electronic band structure of solids. Excellent characteristics of synchrotron radiation light enable us to achieve specialized ARPES measurements. In order to perform such experiments, we have constructed a new beamline BL-2 MUSASHI (Multiple Undulator beamline for Spectroscopic Analysis of Surface and Hetero-Interface) at Photon Factory, KEK. As examples of the specialized ARPES measurements by utilizing the advantage of this beamline, we introduce recent ARPES results on ( 1 ) three-dimensional electronic structures with changing the photon energy, ( 2 ) bulk electronic structures using high energy soft x rays, and ( 3 ) orbital-selective electronic structures by polarization dependent ARPES measurements.\",\"PeriodicalId\":13075,\"journal\":{\"name\":\"Hyomen Kagaku\",\"volume\":\"202 1\",\"pages\":\"553-558\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Hyomen Kagaku\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1380/JSSSJ.38.553\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Hyomen Kagaku","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1380/JSSSJ.38.553","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Angle-Resolved Photoemission Spectroscopy Utilizing Characteristics of Synchrotron Radiation
Angle-resolved photoemission spectroscopy (ARPES) is a powerful experimental tool for revealing the electronic band structure of solids. Excellent characteristics of synchrotron radiation light enable us to achieve specialized ARPES measurements. In order to perform such experiments, we have constructed a new beamline BL-2 MUSASHI (Multiple Undulator beamline for Spectroscopic Analysis of Surface and Hetero-Interface) at Photon Factory, KEK. As examples of the specialized ARPES measurements by utilizing the advantage of this beamline, we introduce recent ARPES results on ( 1 ) three-dimensional electronic structures with changing the photon energy, ( 2 ) bulk electronic structures using high energy soft x rays, and ( 3 ) orbital-selective electronic structures by polarization dependent ARPES measurements.
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