掺杂SrTiO3外延膜中铁价的测定

Proceedings of ISAF-ECAPD-PFM 2012 Pub Date : 2012-09-10 DOI:10.1109/ISAF.2012.6297843

D. Kajewski, J. Szade, J. Kubacki, K. Szot, A. Kohl, C. Lenser, R. Dittmann

{"title":"掺杂SrTiO3外延膜中铁价的测定","authors":"D. Kajewski, J. Szade, J. Kubacki, K. Szot, A. Kohl, C. Lenser, R. Dittmann","doi":"10.1109/ISAF.2012.6297843","DOIUrl":null,"url":null,"abstract":"Atomic Force Microscopy (AFM) measurements have been performed for Fe doped SrTiO3 thin films with an Fe concentration of 2 and 5 at%. Thin films with a thickness of about 20 nm were grown by pulsed laser deposition on single crystalline SrTi0.99Nb0.01O3 substrates. Low-energy electron diffraction examination showed that the films are single crystalline. The regions treated with the AFM tip (applied dc voltage up to 6V) showed inhomogeneity of the electrical conductivity.","PeriodicalId":20497,"journal":{"name":"Proceedings of ISAF-ECAPD-PFM 2012","volume":"37 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2012-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Fe valence determination in doped SrTiO3 epitaxial films\",\"authors\":\"D. Kajewski, J. Szade, J. Kubacki, K. Szot, A. Kohl, C. Lenser, R. Dittmann\",\"doi\":\"10.1109/ISAF.2012.6297843\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Atomic Force Microscopy (AFM) measurements have been performed for Fe doped SrTiO3 thin films with an Fe concentration of 2 and 5 at%. Thin films with a thickness of about 20 nm were grown by pulsed laser deposition on single crystalline SrTi0.99Nb0.01O3 substrates. Low-energy electron diffraction examination showed that the films are single crystalline. The regions treated with the AFM tip (applied dc voltage up to 6V) showed inhomogeneity of the electrical conductivity.\",\"PeriodicalId\":20497,\"journal\":{\"name\":\"Proceedings of ISAF-ECAPD-PFM 2012\",\"volume\":\"37 1\",\"pages\":\"1-3\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-09-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of ISAF-ECAPD-PFM 2012\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISAF.2012.6297843\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of ISAF-ECAPD-PFM 2012","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAF.2012.6297843","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

原子力显微镜(AFM)测量了铁掺杂SrTiO3薄膜，铁浓度为2%和5%。采用脉冲激光沉积技术在单晶srti0.99 nb0.010 o3衬底上生长出厚度约为20 nm的薄膜。低能电子衍射检测表明薄膜为单晶。AFM尖端处理的区域(施加直流电压高达6V)显示出电导率的不均匀性。

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Fe valence determination in doped SrTiO3 epitaxial films

Atomic Force Microscopy (AFM) measurements have been performed for Fe doped SrTiO3 thin films with an Fe concentration of 2 and 5 at%. Thin films with a thickness of about 20 nm were grown by pulsed laser deposition on single crystalline SrTi0.99Nb0.01O3 substrates. Low-energy electron diffraction examination showed that the films are single crystalline. The regions treated with the AFM tip (applied dc voltage up to 6V) showed inhomogeneity of the electrical conductivity.

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Proceedings of ISAF-ECAPD-PFM 2012

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