单维光子晶体缺陷小位移传感器

Алексей Иванович Сидоров, М.В. Махаева
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引用次数: 0

摘要

本文给出了基于近红外范围Si-SiO2层的一维缺陷光子晶体(PC)光学特性的计算机模拟结果。形成PC层的光学厚度分别为λ/4、3λ/4和10λ/4。缺陷是由PC中间的气隙形成的。研究了缺陷厚度对缺陷透射带光谱位置的影响。结果表明,根据传感器几何形状和测量方法的不同,对缺陷厚度d的灵敏度范围为Δλ/Δd = 330 ~ 1200 nm/μm和0.6 ~ 0.85 dB/nm。这使得具有缺陷的1D PC有望用作微小运动传感器的敏感元件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Датчик малых перемещений на основе одномерного фотонного кристалла с дефектом
The results of computer simulation of optical properties of one-dimensional (1D) photonic crystal (PC) with defect, based on the layers Si-SiO2 in near IR range are presented. The optical thicknesses of layers, which form PC, were λ/4, 3λ/4 and 10λ/4. Defect was formed by air gap in the middle of PC. The influence of defect thickness on spectral position of the transmission band of defect was studied. It was shown that the sensitivity on the defect thickness d is in the range of Δλ/Δd = 330-1200 nm/μm and 0.6-0.85 dB/nm, depending on sensor geometry and measurement method. This makes 1D PC with defect promising for the use as sensitive element in sensors of small movements.
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