Internal Stress and Capacitance Aging of BME‐MLCCS

The residual stress and capacitance aging of base metal electrode multilayer ceramic capacitors (BME-MLCCs) has been studied. Residual stress measurement by X-ray diffraction revealed that tensile stress inside MLCCs in the thickness direction increased with increasing number of dielectric layers. The increase in the ratio of the c-axis to the a-axis of BaTiO 3 in the thickness direction of MLCCs was expected from the results of X-ray diffraction with increasing number of dielectric layers. And the dependence of residual stress on capacitance aging was measured of MLCCs with different number of dielectric layers. Capacitance aging depended on the applied voltage and temperature, however capacitance aging under no-load did not depend on the internal stress, because of the change of internal stress of BME-MLCCs with time was small.