{"title":"从结构电路属性预测标准单元互连长度","authors":"H. Heineken, Wojciech Maly","doi":"10.1109/CICC.1996.510535","DOIUrl":null,"url":null,"abstract":"A new interconnect model is proposed that predicts the distribution parameters of net lengths. The model takes as input a standard cell netlist and provides as output estimates of the mean and variance offer length on a net by net basis. The model was developed and verified on designs produced with two different place and route algorithms.","PeriodicalId":74515,"journal":{"name":"Proceedings of the ... Custom Integrated Circuits Conference. Custom Integrated Circuits Conference","volume":"34 1","pages":"167-170"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":"{\"title\":\"Standard cell interconnect length prediction from structural circuit attributes\",\"authors\":\"H. Heineken, Wojciech Maly\",\"doi\":\"10.1109/CICC.1996.510535\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new interconnect model is proposed that predicts the distribution parameters of net lengths. The model takes as input a standard cell netlist and provides as output estimates of the mean and variance offer length on a net by net basis. The model was developed and verified on designs produced with two different place and route algorithms.\",\"PeriodicalId\":74515,\"journal\":{\"name\":\"Proceedings of the ... Custom Integrated Circuits Conference. Custom Integrated Circuits Conference\",\"volume\":\"34 1\",\"pages\":\"167-170\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-05-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"21\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the ... Custom Integrated Circuits Conference. Custom Integrated Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICC.1996.510535\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the ... Custom Integrated Circuits Conference. Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.1996.510535","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Standard cell interconnect length prediction from structural circuit attributes
A new interconnect model is proposed that predicts the distribution parameters of net lengths. The model takes as input a standard cell netlist and provides as output estimates of the mean and variance offer length on a net by net basis. The model was developed and verified on designs produced with two different place and route algorithms.