Structural, Electrical and Sensing properties of Cd-doped ZnTe thin films, prepared by thermal evaporation method

This study concentrates on the examination of the functional, electrical, and sensing qualities of ZnTe thin films that were prepared by the thermal evaporation method, with a thickness of 300 nm deposited on glass bases prior to annealing at a temperature of (350ºC). The influence of doping with cadmium (7%) on the structural, electrical, and sensing properties of dopant films was also investigated. The results of XRD showed that the pure and doped films were polycrystalline and cubic. According to the findings of the electrical properties of this study, the specific resistance decreases with increasing temperature. It was found that the sensitivity of ZnTe films rises upon doping and annealing, so the sensitivity was calculated.