基于a-Si:H引脚电池的CPM测量-一项关键研究

R. Geyer, M. Gorn, N. Kniffler, P. Lechner, H. Rubel, B. Scheppat
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引用次数: 0

摘要

采用恒光电流法研究了非晶氢化硅p-i-n太阳能电池的亚带隙光学吸收光谱。对薄的(标准的)和厚的p-i-n结以及少量n和p掺杂活性层的结进行了比较研究。特性依赖于施加的偏置电压(正向和反向偏置以及短路情况)被观察到。将这些结果与标准测量结果(照明下的I-V曲线,光谱响应)进行了比较。发现乌尔巴赫能量(指数尾的斜率)不依赖于电压偏置,并且在观察到的情况下显示,p- nu -n和p- pi -n二极管相对于p-i-n二极管的预期增强。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
CPM measurements on a-Si:H based pin cells-a critical investigation
The subband gap optical absorption spectra of amorphous hydrogenated silicon p-i-n solar cells were investigated by photocurrent spectroscopy in the CPM (constant photocurrent method) mode. A comparative study was made of thin (standard) and thick p-i-n junctions as well as junctions with slightly n- and p-doped active layers. Characteristic dependencies on the applied bias voltages (forward and reverse bias and short-circuit case) were observed. A critical discussion of these results in comparison to standard measurements (I-V curves under illumination, spectral response) is given. It is found that Urbach energies (slope of the exponential tail) are not voltage bias dependent and show, in the cases observed, the expected enhancement in p- nu -n and p- pi -n diodes with respect to p-i-n diodes.<>
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