优化门滤波器在时间相关单光子计数寿命实验中的后脉冲背景抑制

M. Gerber, R. Kleiman
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引用次数: 2

摘要

利用单稳态多谐振荡器,抑制了单光子雪崩二极管信号相关的后脉冲背景。使用光致发光衰减寿命测量对该数字滤波门进行了表征和优化,显示系统误差减少了测量寿命的25%,与通过降低重复率来抑制后脉冲获得相对可靠的结果所需的时间相比,采集时间提高了约500倍。在10 MHz时,线性动态范围从~2τ增加到~6τ,其中寿命t测量为(5.0±0.1)ns。使用510 nm脉冲二极管激光器、500 nm GaAs层(夹在InGaP封盖层之间)、硅单光子雪崩光电二极管和时间相关单光子计数电子器件进行寿命测量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Afterpulse background suppression in time-correlated single photon counting lifetime experiments using optimized gate filter
Using a monostable multivibrator, the signal-dependent afterpulsing background from a single photon avalanche diode was suppressed. This digital filter gate was characterized and optimized using photoluminescence decay lifetime measurements to show a reduction in systematic error that is 25% of the measured lifetime and ~500X improvement in acquisition time when compared with the time taken to obtain a comparably reliable result by reduction of the repetition rate to suppress afterpulsing. At 10 MHz, there is an increase in the linear dynamic range from ~2τ to ~6τ, where the lifetime, t, was measured to be (5.0±0.1)ns. Lifetime measurements were performed with a pulsed 510 nm diode laser, a 500 nm GaAs layer (sandwiched between InGaP capping layers), a silicon single-photon avalanche photodiode and time-correlated single photon counting electronics.
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