由于重掺杂和杂质尺寸的影响,在300 K时n+ - p晶体硅结太阳能电池的最佳性能。我

H. V. Cong, P. Blaise, O. Henri-Rousseau
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引用次数: 0

摘要

研究了重掺杂和施主(受体)尺寸对分别注入重(轻)掺杂晶体硅(Si)发射极(基底)区域的空穴(电子)少数饱和电流密度JEo(JBo)的影响,该密度可用于确定太阳能电池的性能,该密度受到暗饱和电流密度Jo≡JEo + JBo的强烈影响。为此,我们使用有效的高斯供体密度曲线来确定JEo,并采用两点经验方法来研究理想因子n、短路电流密度Jsc、填充因子(FF)和光伏转换效率η(表示为开路电压Voc的函数),得到了令人满意的描述,并与其他现有的理论和实验结果进行了比较。因此,在完全透明和重掺杂(P-Si)发射极区CTHD(P-Si)ER中,我们得到的jeo结果精度在1.78%以内。因此,这种对JEo的准确表达对于太阳能电池系统的持续性能改进是必不可少的。例如,在CTHD (P-Si) ER和轻掺杂(B-Si)基区LD(B-Si)BR的物理条件下,我们获得了Jsc的精度为8.1%,FF的精度为7.1%,η的精度为5%,因此JBo的精度≤8.1%。此外,在完全不透明和重掺杂(S-Si)发射极区COHD(S-Si)ER和轻掺杂(受体-Si)基极区LD(受体-Si)BR中,由于受体尺寸效应,我们的极限η-结果分别为:27.77%,…,31.55%,根据不同(B,…,Tl)-Si基极区给出的egi值分别为:1.12eV,…,1.34eV。此外,CTHD(供体-Si) ER和LD(Tl-Si)BR的最大η值分别为:24.28%,…,31.51%,根据不同(Sb,…,S)-Si发射极区的egi值分别为:1.11eV,…,1.70eV,这是由于供体尺寸效应。值得注意的是,这两个得到的最高η值几乎相等,为31.51%%,这是因为两个得到的极限η值几乎相同。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Best Performance of n+ - p Crystalline Silicon Junction Solar Cells at 300 K, Due to the Effects of Heavy Doping and Impurity Size. I
The effects of heavy doping and donor (acceptor) size on the hole (electron)-minority saturation current density JEo(JBo), injected respectively into the heavily (lightly) doped crystalline silicon (Si) emitter (base) region of n+ - p junction, which can be applied to determine the performance of solar cells, being strongly affected by the dark saturation current density: Jo≡JEo + JBo, were investigated. For that, we used an effective Gaussian donor-density profile to determine JEo, and an empirical method of two points to investigate the ideality factor n, short circuit current density Jsc, fill factor (FF), and photovoltaic conversion efficiency η, expressed as functions of the open circuit voltage Voc, giving rise to a satisfactory description of our obtained results, being compared also with other existing theoretical-and-experimental ones. So, in the completely transparent and heavily doped (P-Si) emitter region, CTHD(P-Si)ER, our obtained JEo-results were accurate within 1.78%. This accurate expression for JEo is thus imperative for continuing the performance improvement of solar cell systems. For example, in the physical conditions (PCs) of CTHD (P-Si) ER and of lightly doped (B-Si) base region, LD(B-Si)BR, we obtained the precisions of the order of 8.1% for Jsc, 7.1% for FF, and 5% for η, suggesting thus an accuracy of JBo (≤ 8.1%). Further, in the PCs of completely opaque and heavily doped (S-Si) emitter region, COHD(S-Si)ER, and of lightly doped (acceptor-Si) base region, LD(acceptor-Si)BR, our limiting η-results are equal to: 27.77%,…, 31.55%, according to the Egi-values equal to: 1.12eV ,…, 1.34eV, given in various (B,…, Tl)-Si base regions, respectively, being due to the acceptor-size effect. Furthermore, in the PCs of CTHD (donor-Si) ER and of LD(Tl-Si)BR, our maximal η-values are equal to: 24.28%,…, 31.51%, according to the Egi-values equal to: 1.11eV ,…, 1.70eV, given in various (Sb,…, S)-Si emitter regions, respectively, being due to the donor-size effect. It should be noted that these obtained highest η-values are found to be almost equal, as: 31.51%%≃31.55%, coming from the fact that the two obtained limiting J_o-values are almost the same.
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