准二维1T-TaS2/h-BN异质结构器件中的电荷密度波相变

Jonas O. Brown, M. Taheri, Nick R. Sesing, T. Salguero, F. Kargar, A. Balandin
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引用次数: 0

摘要

在这篇特约论文中,我们回顾了最近的研究结果,并报告了单晶1T-TaS2薄膜和1T-TaS2 / h-BN异质结构器件中电荷密度波的相变和去钉钉。已知1T-TaS2在室温以下和室温以上显示电荷密度波相。准二维材料中电荷密度波的脱钉与晶体结构中具有准一维基元的“常规”体电荷密度波材料中的脱钉不同。与具有准一维晶体结构的传统电荷密度波材料的去钉过程相比,1T-TaS2的去钉过程并不伴随着可观察到的电流突然增加。所得结果有助于电荷密度波器件在电子学和光电子学中的应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Charge-density-wave phase transitions in quasi-2D 1T-TaS2/h-BN heterostructure devices
In this invited contribution, we review recent results and report on the phase transitions and de-pinning of the charge-density waves in single-crystal 1T-TaS2 thin-film and 1T-TaS2 / h-BN heterostructure devices. It is known that 1T-TaS2 reveals charge-density-wave phases below and above room temperature. The de-pinning of the charge-density waves in the quasi-2D materials is different from that in “conventional” bulk charge-density-wave materials with quasi-1D motifs in the crystal structure. The de-pinning process in 1T-TaS2 is not accompanied by an observable abrupt increase in electric current – in contrast to de-pinning in the conventional charge-density-wave materials with the quasi-1D crystal structure. The obtained results contribute to the development of the charge-density-wave devices for applications in electronics and optoelectronics.
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