一种新的高代TFT光刻机垂直闭环控制方法

Dan Chen
{"title":"一种新的高代TFT光刻机垂直闭环控制方法","authors":"Dan Chen","doi":"10.1109/CSTIC49141.2020.9282434","DOIUrl":null,"url":null,"abstract":"A prominent problem of TFT lithography machine is that its plate stage's size and weight increase rapidly as it develops to higher generation. Because of plate stage's large size and heavy weight, it could be extremely difficult to achieve high bandwidth. Hence, it could be technical complicatedly and economic expensively to compensate vertical control error by the movement of plate stage. In this paper, a novel vertical closed-loop control method using the idea of coordinated movement of reticle stage and plate stage has been proposed. Experiment results show that, the total vertical control error based on our method has better performance, and CDU results based on these two methods are similar. However, our method has much higher technical feasibility and lower cost.","PeriodicalId":6848,"journal":{"name":"2020 China Semiconductor Technology International Conference (CSTIC)","volume":"282 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2020-06-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Novel Vertical Closed-Loop Control Method for High Generation TFT Lithography Machine\",\"authors\":\"Dan Chen\",\"doi\":\"10.1109/CSTIC49141.2020.9282434\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A prominent problem of TFT lithography machine is that its plate stage's size and weight increase rapidly as it develops to higher generation. Because of plate stage's large size and heavy weight, it could be extremely difficult to achieve high bandwidth. Hence, it could be technical complicatedly and economic expensively to compensate vertical control error by the movement of plate stage. In this paper, a novel vertical closed-loop control method using the idea of coordinated movement of reticle stage and plate stage has been proposed. Experiment results show that, the total vertical control error based on our method has better performance, and CDU results based on these two methods are similar. However, our method has much higher technical feasibility and lower cost.\",\"PeriodicalId\":6848,\"journal\":{\"name\":\"2020 China Semiconductor Technology International Conference (CSTIC)\",\"volume\":\"282 1\",\"pages\":\"1-3\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-06-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 China Semiconductor Technology International Conference (CSTIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CSTIC49141.2020.9282434\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 China Semiconductor Technology International Conference (CSTIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSTIC49141.2020.9282434","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

TFT光刻机的一个突出问题是,随着其向更高代的发展,其印版尺寸和重量迅速增加。由于平板级尺寸大、重量重,实现高带宽的难度极大。因此,利用板台运动补偿垂直控制误差技术复杂,经济昂贵。本文提出了一种利用横板工作台协调运动思想的垂直闭环控制方法。实验结果表明,基于该方法的总垂直控制误差具有更好的性能,且基于这两种方法的CDU结果相似。然而,我们的方法具有更高的技术可行性和更低的成本。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Novel Vertical Closed-Loop Control Method for High Generation TFT Lithography Machine
A prominent problem of TFT lithography machine is that its plate stage's size and weight increase rapidly as it develops to higher generation. Because of plate stage's large size and heavy weight, it could be extremely difficult to achieve high bandwidth. Hence, it could be technical complicatedly and economic expensively to compensate vertical control error by the movement of plate stage. In this paper, a novel vertical closed-loop control method using the idea of coordinated movement of reticle stage and plate stage has been proposed. Experiment results show that, the total vertical control error based on our method has better performance, and CDU results based on these two methods are similar. However, our method has much higher technical feasibility and lower cost.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信