用于硅调试加速的可配置微处理器架构

N. Foutris, D. Gizopoulos, X. Vera, Antonio González
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引用次数: 3

摘要

硅调试在整个微处理器芯片开发周期中的份额正在迅速扩大,这是由于不断增长的设计复杂性和预硅验证方法的有限效率。在微处理器原型芯片上大量应用短随机测试程序是硅调试中最有效的部分之一。然而,这个阶段的主要瓶颈和“噪音”来源是大量随机测试程序由于相同或类似的设计错误而失败。这种冗余行为增加了调试流的长时间延迟,因为必须单独检查每个失败的随机程序,尽管它通常不会带来新的调试信息。开发有效的技术来检测随机程序中的主要故障模式,并将它们分类为常见的类别,从而消除冗余的调试会话,并显著提高硅调试。我们建议采用可配置的微处理器架构以及自检随机测试程序来减少冗余的调试会话,并使硅调试的分类步骤更加高效。高性能微处理器微体系结构的几个硬件组件可以在保持设计功能完整的情况下进行重构。这是我们在硅调试方法中利用的特性,用于随机测试程序的分类。我们通过专用于硅调试的硬件机制来支持我们的方法,该机制根据需要为随机测试程序正确执行而重新配置的微处理器硬件组件将失败的测试程序分组。多个测试程序的相同配置序列表明它们之间存在冗余,并将它们组合在一起。这种分组大大减少了之后必须调试的失败测试的数量。在x86微处理器上对该方法进行了详细的评估,结果表明该方法可以有效地减少调试会话,从而加快芯片调试速度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Deconfigurable microprocessor architectures for silicon debug acceleration
The share of silicon debug in the overall microprocessor chips development cycle is rapidly expanding due to the ever growing design complexity and the limited efficiency of pre-silicon validation methods. Massive application of short random test programs on the prototype microprocessor chips is one of the most effective parts of silicon debug. However, a major bottleneck and source of "noise" in this phase is that large numbers of random test programs fail due to the same or similar design bugs. This redundant behavior adds long delays in the debug flow since each failing random program must be separately examined, although it does not usually bring new debug information. The development of effective techniques that detect dominant modes of failure among random programs and triage them into common categories eliminate redundant debug sessions and significantly boost silicon debug. We propose the employment of deconfigurable microprocessor architectures along with self-checking random test programs to reduce the redundant debug sessions and make the triage step of silicon debug more efficient. Several hardware components of high performance microprocessor micro-architectures can be deconfigured while keeping the functional completeness of the design. This is the property we exploit in our silicon debug methodology for the triaging of random test programs. We support our methodology by a hardware mechanism dedicated to silicon debug that groups the failing test programs into categories depending on the microprocessor hardware components that need to be deconfigured for a random test program to be correctly executed. Identical deconfiguration sequences for multiple test programs indicate the existence of redundancy among them and group them together. This grouping significantly reduces the number of failing tests that must be debugged afterwards. Detailed evaluation of the method on an x86 microprocessor demonstrates its efficiency in reducing the debug sessions and thus in accelerating silicon debug.
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