A. M. Angelotti, G. P. Gibiino, T. Nielsen, F. Tafuri, A. Santarelli
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Three Port Non-Linear Characterization of Power Amplifiers under Modulated Excitations Using a Vector Network Analyzer Platform
This paper presents a novel single-instrument solution for combined characterization of power amplifiers (PAs) at radiofrequency (RF) and baseband. It extends the capabilities of a commercial vector network analyzer (VNA) platform by enabling calibrated and synchronized RF envelope and baseband current/voltage measurements on the supply terminal of the amplifier across several MHz of bandwidth. As an application example, full three-port measurements of a 2-W gallium nitride (GaN) PA are reported.
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