界面在纳米结构CoFe2O4薄膜中的作用

A. Axelsson, F. Aguesse, N. Alford, M. Valant
{"title":"界面在纳米结构CoFe2O4薄膜中的作用","authors":"A. Axelsson, F. Aguesse, N. Alford, M. Valant","doi":"10.1109/ISAF.2012.6297866","DOIUrl":null,"url":null,"abstract":"In bulk ceramics, interfaces between adjacent materials can be neglected when evaluating the individual functional properties on the macroscale. However, in nanostructured materials, a region described as an interfacial region can comprise up to 10% of the total volume. By traditional XRD and SEM these regions may be hard to describe. Here we present how a combination of non destructive material analysis and property analysis brings knowledge of the chemistry at the interfaces and microstructure in the film. Epitaxial thin film CoFe2O4 were grown on several growth templates such as SrTiO3, LaAlO3, BaTiO3 and MgO as to vary the interfacial region and subsequent growth mechanism. The chemical stability and crystallographic matching between the magnetic film and the dielectric growth template are discussed where dramatic changes of the functional properties of these nanoscale structures demonstrate that the interfaces have a deleterious effect on the properties.","PeriodicalId":20497,"journal":{"name":"Proceedings of ISAF-ECAPD-PFM 2012","volume":"12 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2012-07-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Role of interfaces in nanostructured CoFe2O4 films\",\"authors\":\"A. Axelsson, F. Aguesse, N. Alford, M. Valant\",\"doi\":\"10.1109/ISAF.2012.6297866\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In bulk ceramics, interfaces between adjacent materials can be neglected when evaluating the individual functional properties on the macroscale. However, in nanostructured materials, a region described as an interfacial region can comprise up to 10% of the total volume. By traditional XRD and SEM these regions may be hard to describe. Here we present how a combination of non destructive material analysis and property analysis brings knowledge of the chemistry at the interfaces and microstructure in the film. Epitaxial thin film CoFe2O4 were grown on several growth templates such as SrTiO3, LaAlO3, BaTiO3 and MgO as to vary the interfacial region and subsequent growth mechanism. The chemical stability and crystallographic matching between the magnetic film and the dielectric growth template are discussed where dramatic changes of the functional properties of these nanoscale structures demonstrate that the interfaces have a deleterious effect on the properties.\",\"PeriodicalId\":20497,\"journal\":{\"name\":\"Proceedings of ISAF-ECAPD-PFM 2012\",\"volume\":\"12 1\",\"pages\":\"1-4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-07-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of ISAF-ECAPD-PFM 2012\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISAF.2012.6297866\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of ISAF-ECAPD-PFM 2012","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAF.2012.6297866","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

在块状陶瓷中,当在宏观尺度上评估单个功能特性时,相邻材料之间的界面可以被忽略。然而,在纳米结构材料中,被描述为界面区域的区域可以占到总体积的10%。用传统的XRD和SEM很难描述这些区域。在这里,我们展示了无损材料分析和性能分析的结合如何带来界面化学和薄膜微观结构的知识。在SrTiO3、LaAlO3、BaTiO3和MgO等生长模板上生长CoFe2O4外延薄膜,以改变界面区域和随后的生长机制。讨论了磁性薄膜和介电生长模板之间的化学稳定性和晶体学匹配,这些纳米结构的功能特性的急剧变化表明界面对性能有有害影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Role of interfaces in nanostructured CoFe2O4 films
In bulk ceramics, interfaces between adjacent materials can be neglected when evaluating the individual functional properties on the macroscale. However, in nanostructured materials, a region described as an interfacial region can comprise up to 10% of the total volume. By traditional XRD and SEM these regions may be hard to describe. Here we present how a combination of non destructive material analysis and property analysis brings knowledge of the chemistry at the interfaces and microstructure in the film. Epitaxial thin film CoFe2O4 were grown on several growth templates such as SrTiO3, LaAlO3, BaTiO3 and MgO as to vary the interfacial region and subsequent growth mechanism. The chemical stability and crystallographic matching between the magnetic film and the dielectric growth template are discussed where dramatic changes of the functional properties of these nanoscale structures demonstrate that the interfaces have a deleterious effect on the properties.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信