{"title":"5-10 kVA变换器中igbt传导EMI性能的实验与仿真研究","authors":"F. Klotz, J. Petzoldt, H. Volker","doi":"10.1109/PESC.1996.550111","DOIUrl":null,"url":null,"abstract":"Power switches with high dv/dt and di/dt rates like IGBTs are the source of EMI. The paper presents investigations of conducted EMI on IGBTs in different test circuits. Moreover, results are explained from a special developed model for prediction of common and differential mode interferences, that is suitable to determine solutions for a better EMC through other design around the semiconductor chip. Results and further possibilities are discussed.","PeriodicalId":19979,"journal":{"name":"PESC Record. 27th Annual IEEE Power Electronics Specialists Conference","volume":"2010 335","pages":"1986-1991 vol.2"},"PeriodicalIF":0.0000,"publicationDate":"1996-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"Experimental and simulative investigations of conducted EMI performance of IGBTs for 5-10 kVA converters\",\"authors\":\"F. Klotz, J. Petzoldt, H. Volker\",\"doi\":\"10.1109/PESC.1996.550111\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Power switches with high dv/dt and di/dt rates like IGBTs are the source of EMI. The paper presents investigations of conducted EMI on IGBTs in different test circuits. Moreover, results are explained from a special developed model for prediction of common and differential mode interferences, that is suitable to determine solutions for a better EMC through other design around the semiconductor chip. Results and further possibilities are discussed.\",\"PeriodicalId\":19979,\"journal\":{\"name\":\"PESC Record. 27th Annual IEEE Power Electronics Specialists Conference\",\"volume\":\"2010 335\",\"pages\":\"1986-1991 vol.2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-06-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"PESC Record. 27th Annual IEEE Power Electronics Specialists Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PESC.1996.550111\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"PESC Record. 27th Annual IEEE Power Electronics Specialists Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PESC.1996.550111","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Experimental and simulative investigations of conducted EMI performance of IGBTs for 5-10 kVA converters
Power switches with high dv/dt and di/dt rates like IGBTs are the source of EMI. The paper presents investigations of conducted EMI on IGBTs in different test circuits. Moreover, results are explained from a special developed model for prediction of common and differential mode interferences, that is suitable to determine solutions for a better EMC through other design around the semiconductor chip. Results and further possibilities are discussed.
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