Marcus Tornberg, Carina B Maliakkal, Daniel Jacobsson, Reine Wallenberg, Kimberly A Dick
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引用次数: 0
摘要
环境显微镜为研究和分析现实条件下的转化和反应提供了可能性,以便更好地理解这些过程。我们报告了金属有机化学气相沉积(MOCVD)系统的设计和开发情况,该系统与环境透射电子显微镜集成,用于晶体生长的实时研究。我们展示了在样品处实现大范围精确控制前驱体气体浓度的方法,以及利用显微镜柱中其他地方测得的压力校准样品分压的方法。我们评估了极片间隙内温度升高和活性气体对成像和光谱的影响。我们发现 X 射线能量色散光谱会受到超过 500$^{circ }$C 温度的强烈影响,而在相关条件下,空间分辨率基本上不受热量和显微镜压力的影响。最后,我们讨论了电子束对研究过程的影响。通过这项工作,我们旨在为开发先进的原位电子显微镜系统提供重要的投入,以便在现实条件下实时研究复杂的反应,例如在半导体晶体形成过程中使用的反应。
Enabling In Situ Studies of Metal-Organic Chemical Vapor Deposition in a Transmission Electron Microscope.
The world of environmental microscopy provides the possibility to study and analyze transformations and reactions during realistic conditions to understand the processes better. We report on the design and development of a metal-organic chemical vapor deposition (MOCVD) system integrated with an environmental transmission electron microscope intended for real-time investigations of crystal growth. We demonstrate methods for achieving a wide range of precisely controlled concentrations of precursor gas at the sample, as well as for calibrating the sample partial pressure using the pressure measured elsewhere in the microscope column. The influences of elevated temperature and reactive gas within the pole-piece gap are evaluated with respect to imaging and spectroscopy. We show that X-ray energy-dispersive spectroscopy can be strongly affected by temperatures beyond 500$^{\circ }$C, while the spatial resolution is largely unaffected by heat and microscope pressure for the relevant conditions. Finally, the influence of the electron beam on the investigated processes is discussed. With this work, we aim to provide crucial input in the development of advanced in situ electron microscopy systems for studies of complex reactions in real time under realistic conditions, for instance as used during formation of semiconductor crystals.