{"title":"短波长电子干涉在材料测试中的应用","authors":"S. Yamaguchi, M. Uda","doi":"10.1016/0390-6035(82)90097-9","DOIUrl":null,"url":null,"abstract":"<div><p>An electron diffraction procedure with the short wavelength (about 0.027 Å) proved to give rise to the interference patterns with high S-N ratio. This was demonstrated with the brilliant face of diamond and with a rolled film of pure gold. The observations served for identifying diamond and gold in terms of nondestructive analysis.</p></div>","PeriodicalId":18221,"journal":{"name":"Materials Chemistry","volume":"7 4","pages":"Pages 573-576"},"PeriodicalIF":0.0000,"publicationDate":"1982-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0390-6035(82)90097-9","citationCount":"0","resultStr":"{\"title\":\"Anwendung der elektroneninterferenz mit der kurzen wellenlänge zur materialprüfung\",\"authors\":\"S. Yamaguchi, M. Uda\",\"doi\":\"10.1016/0390-6035(82)90097-9\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>An electron diffraction procedure with the short wavelength (about 0.027 Å) proved to give rise to the interference patterns with high S-N ratio. This was demonstrated with the brilliant face of diamond and with a rolled film of pure gold. The observations served for identifying diamond and gold in terms of nondestructive analysis.</p></div>\",\"PeriodicalId\":18221,\"journal\":{\"name\":\"Materials Chemistry\",\"volume\":\"7 4\",\"pages\":\"Pages 573-576\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1982-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/0390-6035(82)90097-9\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Materials Chemistry\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/0390603582900979\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials Chemistry","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0390603582900979","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Anwendung der elektroneninterferenz mit der kurzen wellenlänge zur materialprüfung
An electron diffraction procedure with the short wavelength (about 0.027 Å) proved to give rise to the interference patterns with high S-N ratio. This was demonstrated with the brilliant face of diamond and with a rolled film of pure gold. The observations served for identifying diamond and gold in terms of nondestructive analysis.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
