将精度转移到跟踪级，然后转移到现场

Journal of research of the National Bureau of Standards Pub Date : 1988-05-01 DOI:10.6028/jres.093.142

Paul De Biévre

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引用次数: 1

摘要

[5] Piccone，T.J.、Butrymowicz，D.B.、Newbury，D.E.、Mannig，J.R.和Cahn，J.W.，Scripta Met。，839（1982）。[6] Myklebust，R.L.、Newbury，D.E.、Marinenko，R.B.和Bright，D.S.，利用波长色散X射线光谱法进行电子微探针成分图的背景校正，微束分析，旧金山出版社（1987）25。[7] Garruto，R.M.、Swyt，C.、Fiori，C.E.、Yanagihara，R.和Gajdusek，D.，《柳叶刀》，1353（1985）。

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Transferring Accuracy to the Trace Level and Then to the Field

[5] Piccone, T. J., Butrymowicz, D. B., Newbury, D. E., Mannig, J. R., and Cahn, J. W., Scripta Met., 839 (1982). [6] Myklebust, R. L., Newbury, D. E., Marinenko, R. B., and Bright, D. S., Background Correction in Electron Microprobe Compositional Mapping with Wavelength-Dispersive X-ray Spectrometry, Microbeam Analysis, San Francisco Press (1987) 25. [7] Garruto, R. M., Swyt, C., Fiori, C. E., Yanagihara, R., and Gajdusek, D. D., Lancet, 1353 (1985).

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Journal of research of the National Bureau of Standards

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