基于FTIR干涉图的相位校正技术研究基于FTIR干涉图的相位校正技术研究

{"title":"基于FTIR干涉图的相位校正技术研究基于FTIR干涉图的相位校正技术研究","authors":"Chao Zhu, Changhua Lu, Wenqing Liu, Yujun Zhang, Xiaoting Chen, Kai Yang","doi":"10.3724/SP.J.1187.2013.00663","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":58398,"journal":{"name":"电子测量与仪器学报","volume":"140 1","pages":"663-668"},"PeriodicalIF":0.0000,"publicationDate":"2014-03-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Research of phase correction technology based on interference pattern in FTIR: Research of phase correction technology based on interference pattern in FTIR\",\"authors\":\"Chao Zhu, Changhua Lu, Wenqing Liu, Yujun Zhang, Xiaoting Chen, Kai Yang\",\"doi\":\"10.3724/SP.J.1187.2013.00663\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":58398,\"journal\":{\"name\":\"电子测量与仪器学报\",\"volume\":\"140 1\",\"pages\":\"663-668\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-03-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"电子测量与仪器学报\",\"FirstCategoryId\":\"1087\",\"ListUrlMain\":\"https://doi.org/10.3724/SP.J.1187.2013.00663\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"电子测量与仪器学报","FirstCategoryId":"1087","ListUrlMain":"https://doi.org/10.3724/SP.J.1187.2013.00663","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}