LIBRA:片上光子网络中的热和过程变化感知可靠性管理

sai vineel reddy chittamuru;Ishan G. Thakkar;Sudeep Pasricha
{"title":"LIBRA:片上光子网络中的热和过程变化感知可靠性管理","authors":"sai vineel reddy chittamuru;Ishan G. Thakkar;Sudeep Pasricha","doi":"10.1109/TMSCS.2018.2846274","DOIUrl":null,"url":null,"abstract":"Silicon nanophotonics technology is being considered for future networks-on-chip (NoCs) as it can enable high bandwidth density and lower latency with traversal of data at the speed of light. But, the operation of photonic NoCs (PNoCs) is very sensitive to on-chip temperature and process variations. These variations can create significant reliability issues for PNoCs. For example, a microring resonator (MR) may resonate at another wavelength instead of its designated wavelength due to thermal and/or process variations, which can lead to bandwidth wastage and data corruption in PNoCs. This paper proposes a novel run-time framework called \n<italic>LIBRA</i>\n to overcome temperature- and process variation- induced reliability issues in PNoCs. The framework consists of (i) a device-level reactive MR assignment mechanism that dynamically assigns a group of MRs to reliably modulate/receive data in a waveguide based on the chip thermal and process variation characteristics; and (ii) a system-level proactive thread migration technique to avoid on-chip thermal threshold violations and reduce MR tuning/ trimming power by dynamically migrating threads between cores. Our simulation results indicate that \n<italic>LIBRA</i>\n can reliably satisfy on-chip thermal thresholds and maintain high network bandwidth while reducing total power by up to 61.3 percent, and thermal tuning/trimming power by up to 76.2 percent over state-of-the-art thermal and process variation aware solutions.","PeriodicalId":100643,"journal":{"name":"IEEE Transactions on Multi-Scale Computing Systems","volume":"4 4","pages":"758-772"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/TMSCS.2018.2846274","citationCount":"22","resultStr":"{\"title\":\"LIBRA: Thermal and Process Variation Aware Reliability Management in Photonic Networks-on-Chip\",\"authors\":\"sai vineel reddy chittamuru;Ishan G. Thakkar;Sudeep Pasricha\",\"doi\":\"10.1109/TMSCS.2018.2846274\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Silicon nanophotonics technology is being considered for future networks-on-chip (NoCs) as it can enable high bandwidth density and lower latency with traversal of data at the speed of light. But, the operation of photonic NoCs (PNoCs) is very sensitive to on-chip temperature and process variations. These variations can create significant reliability issues for PNoCs. For example, a microring resonator (MR) may resonate at another wavelength instead of its designated wavelength due to thermal and/or process variations, which can lead to bandwidth wastage and data corruption in PNoCs. This paper proposes a novel run-time framework called \\n<italic>LIBRA</i>\\n to overcome temperature- and process variation- induced reliability issues in PNoCs. The framework consists of (i) a device-level reactive MR assignment mechanism that dynamically assigns a group of MRs to reliably modulate/receive data in a waveguide based on the chip thermal and process variation characteristics; and (ii) a system-level proactive thread migration technique to avoid on-chip thermal threshold violations and reduce MR tuning/ trimming power by dynamically migrating threads between cores. Our simulation results indicate that \\n<italic>LIBRA</i>\\n can reliably satisfy on-chip thermal thresholds and maintain high network bandwidth while reducing total power by up to 61.3 percent, and thermal tuning/trimming power by up to 76.2 percent over state-of-the-art thermal and process variation aware solutions.\",\"PeriodicalId\":100643,\"journal\":{\"name\":\"IEEE Transactions on Multi-Scale Computing Systems\",\"volume\":\"4 4\",\"pages\":\"758-772\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-06-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1109/TMSCS.2018.2846274\",\"citationCount\":\"22\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Multi-Scale Computing Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/8382285/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Multi-Scale Computing Systems","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/8382285/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 22

摘要

硅纳米光子学技术正被考虑用于未来的片上网络(NoCs),因为它可以实现高带宽密度和更低的延迟,以光速遍历数据。但是,光子NoCs(PNoCs)的操作对片上温度和工艺变化非常敏感。这些变化可能会给PNoCs带来重大的可靠性问题。例如,由于热和/或工艺变化,微环谐振器(MR)可能以另一波长而不是其指定波长谐振,这可能导致PNoCs中的带宽浪费和数据损坏。本文提出了一种新的运行时框架,称为LIBRA,以克服PNoCs中由温度和工艺变化引起的可靠性问题。该框架由(i)设备级反应性MR分配机制组成,该机制基于芯片热和工艺变化特性动态地分配一组MR以可靠地调制/接收波导中的数据;以及(ii)系统级主动线程迁移技术,以通过在内核之间动态迁移线程来避免芯片上热阈值违反并降低MR调谐/微调功率。我们的模拟结果表明,与最先进的热和工艺变化感知解决方案相比,LIBRA可以可靠地满足片上热阈值并保持高网络带宽,同时将总功率降低61.3%,热调谐/微调功率降低76.2%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
LIBRA: Thermal and Process Variation Aware Reliability Management in Photonic Networks-on-Chip
Silicon nanophotonics technology is being considered for future networks-on-chip (NoCs) as it can enable high bandwidth density and lower latency with traversal of data at the speed of light. But, the operation of photonic NoCs (PNoCs) is very sensitive to on-chip temperature and process variations. These variations can create significant reliability issues for PNoCs. For example, a microring resonator (MR) may resonate at another wavelength instead of its designated wavelength due to thermal and/or process variations, which can lead to bandwidth wastage and data corruption in PNoCs. This paper proposes a novel run-time framework called LIBRA to overcome temperature- and process variation- induced reliability issues in PNoCs. The framework consists of (i) a device-level reactive MR assignment mechanism that dynamically assigns a group of MRs to reliably modulate/receive data in a waveguide based on the chip thermal and process variation characteristics; and (ii) a system-level proactive thread migration technique to avoid on-chip thermal threshold violations and reduce MR tuning/ trimming power by dynamically migrating threads between cores. Our simulation results indicate that LIBRA can reliably satisfy on-chip thermal thresholds and maintain high network bandwidth while reducing total power by up to 61.3 percent, and thermal tuning/trimming power by up to 76.2 percent over state-of-the-art thermal and process variation aware solutions.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信