{"title":"组合合成(GaxIn1-x)2O3固溶体体系的价带修饰","authors":"Takahiro Nagata*, Takeshi Hoga, Akihiro Yamashita, Toru Asahi, Shinjiro Yagyu, Toyohiro Chikyow","doi":"10.1021/acscombsci.0c00033","DOIUrl":null,"url":null,"abstract":"<p >The correlation between the crystal structure and valence band structure of a (Ga<sub><i>x</i></sub>In<sub>1–<i>x</i></sub>)<sub>2</sub>O<sub>3</sub> solid solution system was investigated by using combinatorial synthesis. At a low Ga content of (Ga<sub><i>x</i></sub>In<sub>1–<i>x</i></sub>)<sub>2</sub>O<sub>3</sub> with a single-phase cubic In<sub>2</sub>O<sub>3</sub> crystal structure, a surface electron accumulation layer (SEAL), which is an important electrical phenomenon in In<sub>2</sub>O<sub>3</sub>, was confirmed. When the Ga content increased to approximately <i>x</i> = 0.4, mixed crystal structures of Ga<sub>2</sub>O<sub>3</sub> and In<sub>2</sub>O<sub>3</sub> were produced. Above <i>x</i> = 0.5, the dominant valence band structure was attributed to Ga<sub>2</sub>O<sub>3</sub>, the SEAL disappeared, and the sheet resistance increased greatly by 5 orders of magnitude or more. The in-gap state and valence band structure of the (Ga<sub><i>x</i></sub>In<sub>1–<i>x</i></sub>)<sub>2</sub>O<sub>3</sub> solid solution system were strongly affected by Ga<sub>2</sub>O<sub>3</sub>; however, the valence band maximum position shifted to a higher binding energy.</p>","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":null,"pages":null},"PeriodicalIF":4.3000,"publicationDate":"2020-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1021/acscombsci.0c00033","citationCount":"7","resultStr":"{\"title\":\"Valence Band Modification of a (GaxIn1–x)2O3 Solid Solution System Fabricated by Combinatorial Synthesis\",\"authors\":\"Takahiro Nagata*, Takeshi Hoga, Akihiro Yamashita, Toru Asahi, Shinjiro Yagyu, Toyohiro Chikyow\",\"doi\":\"10.1021/acscombsci.0c00033\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p >The correlation between the crystal structure and valence band structure of a (Ga<sub><i>x</i></sub>In<sub>1–<i>x</i></sub>)<sub>2</sub>O<sub>3</sub> solid solution system was investigated by using combinatorial synthesis. At a low Ga content of (Ga<sub><i>x</i></sub>In<sub>1–<i>x</i></sub>)<sub>2</sub>O<sub>3</sub> with a single-phase cubic In<sub>2</sub>O<sub>3</sub> crystal structure, a surface electron accumulation layer (SEAL), which is an important electrical phenomenon in In<sub>2</sub>O<sub>3</sub>, was confirmed. When the Ga content increased to approximately <i>x</i> = 0.4, mixed crystal structures of Ga<sub>2</sub>O<sub>3</sub> and In<sub>2</sub>O<sub>3</sub> were produced. Above <i>x</i> = 0.5, the dominant valence band structure was attributed to Ga<sub>2</sub>O<sub>3</sub>, the SEAL disappeared, and the sheet resistance increased greatly by 5 orders of magnitude or more. The in-gap state and valence band structure of the (Ga<sub><i>x</i></sub>In<sub>1–<i>x</i></sub>)<sub>2</sub>O<sub>3</sub> solid solution system were strongly affected by Ga<sub>2</sub>O<sub>3</sub>; however, the valence band maximum position shifted to a higher binding energy.</p>\",\"PeriodicalId\":3,\"journal\":{\"name\":\"ACS Applied Electronic Materials\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2020-07-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1021/acscombsci.0c00033\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Electronic Materials\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://pubs.acs.org/doi/10.1021/acscombsci.0c00033\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"92","ListUrlMain":"https://pubs.acs.org/doi/10.1021/acscombsci.0c00033","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Valence Band Modification of a (GaxIn1–x)2O3 Solid Solution System Fabricated by Combinatorial Synthesis
The correlation between the crystal structure and valence band structure of a (GaxIn1–x)2O3 solid solution system was investigated by using combinatorial synthesis. At a low Ga content of (GaxIn1–x)2O3 with a single-phase cubic In2O3 crystal structure, a surface electron accumulation layer (SEAL), which is an important electrical phenomenon in In2O3, was confirmed. When the Ga content increased to approximately x = 0.4, mixed crystal structures of Ga2O3 and In2O3 were produced. Above x = 0.5, the dominant valence band structure was attributed to Ga2O3, the SEAL disappeared, and the sheet resistance increased greatly by 5 orders of magnitude or more. The in-gap state and valence band structure of the (GaxIn1–x)2O3 solid solution system were strongly affected by Ga2O3; however, the valence band maximum position shifted to a higher binding energy.