{"title":"从纳米尺度的角度介绍用于电子传输器件的二维六角形带结构的检验","authors":"C. Krowne","doi":"10.1016/BS.AIEP.2019.01.001","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2019.01.001","citationCount":"3","resultStr":"{\"title\":\"Introduction to examination of 2D hexagonal band structure from a nanoscale perspective for use in electronic transport devices\",\"authors\":\"C. Krowne\",\"doi\":\"10.1016/BS.AIEP.2019.01.001\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":50863,\"journal\":{\"name\":\"Advances in Imaging and Electron Physics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/BS.AIEP.2019.01.001\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advances in Imaging and Electron Physics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1016/BS.AIEP.2019.01.001\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"Physics and Astronomy\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advances in Imaging and Electron Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/BS.AIEP.2019.01.001","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Physics and Astronomy","Score":null,"Total":0}
期刊介绍:
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.