掺杂碲化铅缺陷水平的受激复合

S.D. Darchuk, F.F. Sizov, L.A. Korovina
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引用次数: 2

摘要

研究了Na和Tl掺杂p型PbTe单晶在T = 77 K时光激发载流子从带隙缺陷能级到价带态的弛豫过程。所观察到的光信号振荡是由价带顶部以上缺陷能级Ed≈50 meV的光激发载流子受激复合引起的。利用TEA co2激光器脉冲产生非平衡载流子反转居群。观察到的受激复合可能用于设计工作在T = 77 K λ ~ 25 μm波长范围内的红外半导体激光器。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Stimulated recombination from the defect level in doped lead telluride

The relaxation processes of the photoexcited carriers from the defect level in the band gap to the valence band states were investigated in Na and Tl doped p-type PbTe single crystals at T = 77 K. The observed photosignal oscillations were proved to be induced by stimulated recombination of photoexcited carriers from the defect level Ed ≈ 50 meV above the top of the valence band. Non-equilibrium carrier inversion population was produced by impulses of a TEA CO2-laser. The observed stimulated recombination may presumably be used for designing IR semiconductor lasers operating in the wavelength range of λ ∼ 25 μm at T = 77 K.

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