具有载流子漂移速度横向梯度的半导体的光电导率

A. Medvid́, M. Ogrinsh
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引用次数: 0

摘要

研究了具有载流子漂移速度梯度的半导体的光谱光敏性。根据入射光和梯度的相互方向,发现它是选择性的或热量型的。在室温条件下,在0.8 ~ 2.2 μm光谱范围内实验研究了环形锗样品的光电导率。主要结果是:在梯度不同于指数梯度的半导体中,光电流的衰减取决于梯度和载流子扩散的相互方向;光电流的振幅不仅与典型参数有关,还与光的方向和梯度有关;对于具有漂移速度梯度的半导体,用Moss方法确定载流子的有效寿命和带隙是无效的;一种参数由电场可逆控制的光电探测器是可能的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Photoconductivity of a semiconductor with a transverse gradient of drift velocity of charge carriers

The spectral photosensitivity of a semiconductor with a gradient of the drift velocity of charge carriers has been investigated. It was found to be of either selective or bolometric type depending on mutual directions of incident light and of the gradient. Photoconductivity of germanium samples of ringlike geometry was studied experimentally over the spectral range 0.8–2.2 μm at room temperature. The main results are: decay of the photocurrent in a semiconductor where the gradient differs from the exponential one and depends on the mutual directions of the gradient and diffusion of carriers; the amplitude of the photocurrent depends not only on the typical parameters but on light direction and also gradient; determination of both effective lifetime of carriers and the bandgap by the Moss method is not valid for a semiconductor with a gradient of drift velocity; a photodetector with parameters reversibly controlled by an electric field is possible.

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