{"title":"测定Hg1−xCdxTe样品组成的一般光学表征方法","authors":"Vishnu Gopal, R. Ashokan, A.K. Gupta","doi":"10.1016/0020-0891(93)90037-8","DOIUrl":null,"url":null,"abstract":"<div><p>The rate of variation of transmission as a function of frequency or energy exhibits a maximum in the fundamental absorption region of the alloy semiconductor Hg<sub>1−<em>x</em></sub>Cd<sub><em>x</em></sub>Te. The maximum steepness occurs in the tail region of the absorption edge and its frequency can be correlated analytically with the composition. From the experimental measurements of room temperature IR transmission on both bulk grown and epilayers of Hg<sub>1−<em>x</em></sub>Cd<sub><em>x</em></sub>Te, it is shown that an analysis of the transmission curve at (d<em>T</em><sub>r</sub>/d<em>E</em>)<sub>max</sub> leads to the determination of composition and compositional uniformity in the given sample.</p></div>","PeriodicalId":81524,"journal":{"name":"Infrared physics","volume":"34 1","pages":"Pages 83-87"},"PeriodicalIF":0.0000,"publicationDate":"1993-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0020-0891(93)90037-8","citationCount":"0","resultStr":"{\"title\":\"A general optical characterization method for determining the composition of Hg1−xCdxTe samples\",\"authors\":\"Vishnu Gopal, R. Ashokan, A.K. Gupta\",\"doi\":\"10.1016/0020-0891(93)90037-8\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>The rate of variation of transmission as a function of frequency or energy exhibits a maximum in the fundamental absorption region of the alloy semiconductor Hg<sub>1−<em>x</em></sub>Cd<sub><em>x</em></sub>Te. The maximum steepness occurs in the tail region of the absorption edge and its frequency can be correlated analytically with the composition. From the experimental measurements of room temperature IR transmission on both bulk grown and epilayers of Hg<sub>1−<em>x</em></sub>Cd<sub><em>x</em></sub>Te, it is shown that an analysis of the transmission curve at (d<em>T</em><sub>r</sub>/d<em>E</em>)<sub>max</sub> leads to the determination of composition and compositional uniformity in the given sample.</p></div>\",\"PeriodicalId\":81524,\"journal\":{\"name\":\"Infrared physics\",\"volume\":\"34 1\",\"pages\":\"Pages 83-87\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-02-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/0020-0891(93)90037-8\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Infrared physics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/0020089193900378\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Infrared physics","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0020089193900378","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A general optical characterization method for determining the composition of Hg1−xCdxTe samples
The rate of variation of transmission as a function of frequency or energy exhibits a maximum in the fundamental absorption region of the alloy semiconductor Hg1−xCdxTe. The maximum steepness occurs in the tail region of the absorption edge and its frequency can be correlated analytically with the composition. From the experimental measurements of room temperature IR transmission on both bulk grown and epilayers of Hg1−xCdxTe, it is shown that an analysis of the transmission curve at (dTr/dE)max leads to the determination of composition and compositional uniformity in the given sample.
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