{"title":"测定吸收基底上吸收膜光学常数的包络法","authors":"D.B. Kushev, N.N. Zheleva, M.I. Gyulmezov, M.H. Koparanova","doi":"10.1016/0020-0891(93)90005-R","DOIUrl":null,"url":null,"abstract":"<div><p>A simple variant of the envelope method for deducing optical constants from the interference extrema of the front reflectivity, is extended to the case of an absorbing film on a strongly absorbing substrate. The envelope method is applied to the experimental spectra of SnTe epitaxial layers on metal substrates.</p></div>","PeriodicalId":81524,"journal":{"name":"Infrared physics","volume":"34 2","pages":"Pages 163-167"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0020-0891(93)90005-R","citationCount":"7","resultStr":"{\"title\":\"An envelope method for determination of the optical constants of absorptive films on absorptive substrates\",\"authors\":\"D.B. Kushev, N.N. Zheleva, M.I. Gyulmezov, M.H. Koparanova\",\"doi\":\"10.1016/0020-0891(93)90005-R\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>A simple variant of the envelope method for deducing optical constants from the interference extrema of the front reflectivity, is extended to the case of an absorbing film on a strongly absorbing substrate. The envelope method is applied to the experimental spectra of SnTe epitaxial layers on metal substrates.</p></div>\",\"PeriodicalId\":81524,\"journal\":{\"name\":\"Infrared physics\",\"volume\":\"34 2\",\"pages\":\"Pages 163-167\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/0020-0891(93)90005-R\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Infrared physics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/002008919390005R\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Infrared physics","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/002008919390005R","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An envelope method for determination of the optical constants of absorptive films on absorptive substrates
A simple variant of the envelope method for deducing optical constants from the interference extrema of the front reflectivity, is extended to the case of an absorbing film on a strongly absorbing substrate. The envelope method is applied to the experimental spectra of SnTe epitaxial layers on metal substrates.
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