Utilisation de techniques spectroscopiques pour l'etude de particules atmospheriques produites par des sources ponctuelles

Secondary Ion Mass Spectrometry (SIMS) is used to study atmospheric particle production by an industrial source responsible for the acid precipitation phenomenon. A sampling network has been put in place at Rouyn-Noranda to collect local aerosols with cascade impactors. Aerosols have also been collected in the plume of the most important source of SO₂ in Quebec. Instruments have been developed and constructed to collect these samples. A multi-analytical technique approach permits physico-chemical analysis of individual aerosol: SIMS using a 1 μm ion probe and Scanning Electron Microscopy (SEM) coupled with an X-ray analyzer (EDAX) perform micro-analysis, whereas bulk analysis is provided by a SIMS using a 200 μm Argon ion probe. Devices used for localization of microparticles permit manipulation of samples without damaging them and allow analysis of individual aerosol particles with a SIMS after analysis with SEM-EDAX. Laser Microprobe Mass Analysis (LAMMA) is also possible. Negative and positive mass spectra, obtained with a SIMS-Ar⁺, have been analyzed with a multivariate statistical technique. Relations between these mass spectra and specific conditions existing during sampling have been determined.