{"title":"测试、测量和诊断","authors":"A. Küchler","doi":"10.1007/978-3-642-11993-4_6","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":34930,"journal":{"name":"Gaodianya Jishu/High Voltage Engineering","volume":"1 1","pages":"355-496"},"PeriodicalIF":0.0000,"publicationDate":"2018-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1007/978-3-642-11993-4_6","citationCount":"2","resultStr":"{\"title\":\"Testing, Measuring and Diagnosis\",\"authors\":\"A. Küchler\",\"doi\":\"10.1007/978-3-642-11993-4_6\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":34930,\"journal\":{\"name\":\"Gaodianya Jishu/High Voltage Engineering\",\"volume\":\"1 1\",\"pages\":\"355-496\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1007/978-3-642-11993-4_6\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Gaodianya Jishu/High Voltage Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/978-3-642-11993-4_6\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Gaodianya Jishu/High Voltage Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-642-11993-4_6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"Engineering","Score":null,"Total":0}