Cu2NiXS4 (X=Sn, Ge, Si)体系带隙调谐与电子结构分析:mBJ精度与DFT费用

Dilshod Nematov
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引用次数: 0

摘要

Cu2NiXS4(X)的能带和带隙​=​Sn,Ge,Si)半导体材料的量子化学计算已经在DFT框架内进行了研究和分析。利用不同的交换相关泛函,估计和确定了所研究系统的能隙,并详细研究了它们的能带结构。基于自旋极化和自旋轨道mBJ计算的结果,t2g态的能带和值为1.32、1.56和2.58的直接带隙​ 对于Cu2NiSnS4、Cu2NiGeS4和Cu2NiSiS4,分别发现了eV,表明这些材料适合作为新一代太阳能电池的合适光吸收层。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Bandgap tuning and analysis of the electronic structure of the Cu2NiXS4 (X=Sn, Ge, Si) system: mBJ accuracy with DFT expense

Bandgap tuning and analysis of the electronic structure of the Cu2NiXS4 (X=Sn, Ge, Si) system: mBJ accuracy with DFT expense

The energy bands and band gaps of Cu2NiXS4 (X ​= ​Sn, Ge, Si) semiconductor materials have been studied and analyzed by using quantum-chemical calculations within the DFT framework. Using different exchange-correlation functionals, the energy gaps of the studied systems were estimated and determined, and their band structure were studied in detail. Based on the results of spin-polarized and spin-orbit mBJ-calculations, bands of t2g states and direct band gaps with values of 1.32, 1.56, and 2.58 ​ eV, were found for Cu2NiSnS4, Cu2NiGeS4, and Cu2NiSiS4, respectively, indicating the suitability of these materials as a suitable light-absorbing layer for a new generation solar cells.

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