集成分布反馈激光二极管与电吸收调制器微波相互作用的测量与表征

Q1 Engineering
Fei Yuan, Chao Jing, Meng-Ke Wang, Shang-Jian Zhang, Zhi-Yao Zhang, Yong Liu
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引用次数: 0

摘要

集成电吸收调制分布式反馈激光二极管(EMLs)以其结构紧凑、功耗低、调制速度快等优点在光通信领域受到广泛关注。在集成EML中,分布反馈激光二极管(DFB-LD)与电吸收调制器(EAM)之间的微波相互作用对调制性能有不可忽视的影响,特别是在高频区域。本文将集成EML作为一个具有两个电输入和一个光输出的三端口网络进行研究,并从理论上推导了集成器件的散射矩阵,并进行了实验测量。在理论模型和实测数据的基础上,建立了集成器件的微波等效电路模型,成功提取了DFB-LD与EAM之间的微波相互作用。结果表明,集成EML内部的微波相互作用既有电隔离又有光耦合。电隔离是双向的,而光耦合是定向的,这加剧了从DFB-LD到EAM方向上的微波相互作用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Measurement and characterization of microwave interaction between integrated distributed feedback laser diode and electro-absorption modulator

Integrated electro-absorption-modulated distributed feedback laser diodes (EMLs) are attracting much interest in optical communications for the advantages of a compact structure, low power consumption, and high-speed modulation. In integrated EML, the microwave interaction between the distributed feedback laser diode (DFB-LD) and the electro-absorption modulator (EAM) has a nonnegligible influence on the modulation performance, especially at the high-frequency region. In this paper, integrated EML was investigated as a three-port network with two electrical inputs and a single optical output, where the scattering matrix of the integrated device was theoretically deduced and experimentally measured. Based on the theoretical model and the measured data, the microwave equivalent circuit model of the integrated device was established, from which the microwave interaction between DFB-LD and EAM was successfully extracted. The results reveal that the microwave interaction within integrated EML contains both the electrical isolation and optical coupling. The electrical isolation is bidirectional while the optical coupling is directional, which aggravates the microwave interaction in the direction from DFB-LD to EAM.

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来源期刊
Journal of Electronic Science and Technology
Journal of Electronic Science and Technology Engineering-Electrical and Electronic Engineering
CiteScore
4.30
自引率
0.00%
发文量
1362
审稿时长
99 days
期刊介绍: JEST (International) covers the state-of-the-art achievements in electronic science and technology, including the most highlight areas: ¨ Communication Technology ¨ Computer Science and Information Technology ¨ Information and Network Security ¨ Bioelectronics and Biomedicine ¨ Neural Networks and Intelligent Systems ¨ Electronic Systems and Array Processing ¨ Optoelectronic and Photonic Technologies ¨ Electronic Materials and Devices ¨ Sensing and Measurement ¨ Signal Processing and Image Processing JEST (International) is dedicated to building an open, high-level academic journal supported by researchers, professionals, and academicians. The Journal has been fully indexed by Ei INSPEC and has published, with great honor, the contributions from more than 20 countries and regions in the world.
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