量化包含平面和弯曲晶界的多晶体之间的性质差异

IF 3.3 Q3 NANOSCIENCE & NANOTECHNOLOGY
R. Forrest, E. Lazar, S. Goel, Jonathan J. Bean
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引用次数: 0

摘要

有几种方法可以制作晶界进行建模,但大多数方法都会产生平面(平面)晶粒。在这项研究中,我们研究了由平面晶界和弯曲晶界组成的多晶系统之间材料性能的差异。确定了两个系统的几个结构和机械性能。对于具有弯曲晶界的系统,发现弹性模量的大小都较大,多余体积相当,塑性性能较小。此外,使用晶粒跟踪算法来确定具有平面和弯曲晶界的多晶系统之间检测到的三结数量的差异。这可以从理论上确定,并与简单的模型系统进行比较。我们发现,平面晶界系统比弯曲晶界系统具有明显更多的三结,其倍数为2。当两种类型的系统发生晶粒生长时,当在平面晶界系统中生长异常紧密堆积的六方相时,它们之间也存在系统差异。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Quantifying the differences in properties between polycrystals containing planar and curved grain boundaries
There are several methods in which grain boundaries can be made for modelling, but most produce planar (flat) grains. In this study, we investigated the difference in materials properties between polycrystalline systems comprised of planar grain and curved grain boundaries. Several structural and mechanical properties for both systems were determined. For systems with curved grain boundaries, it was found that the elastic moduli are all larger in magnitude, the excess volumes are comparable, and the plastic properties are smaller. In addition, a grain tracking algorithm was used to determine the differences in the numbers of triple junctions detected between polycrystalline systems with planar and curved grain boundaries. This can be theoretically determined and compared to a simple model system. We find that planar systems of grain boundaries possess significantly more triple junctions than systems of curved grain boundaries by a factor of two. There are also systematic differences between the two types of a system when they undergo grain growth, when there is an anomalous close-packed hexagonal phase which grows in the system of planar grain boundaries.
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来源期刊
Nanofabrication
Nanofabrication NANOSCIENCE & NANOTECHNOLOGY-
自引率
10.30%
发文量
13
审稿时长
16 weeks
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