界面陷阱电荷对无结材料圆柱形环绕栅MOSFET性能影响的研究

{"title":"界面陷阱电荷对无结材料圆柱形环绕栅MOSFET性能影响的研究","authors":"Lagraf , F., Rechem , D., Guergouri , K.","doi":"10.12816/0056116","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":16506,"journal":{"name":"Journal of New Technology and Materials","volume":" ","pages":""},"PeriodicalIF":0.8000,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Study of Interface Trapped Charges Effect on Performance of Junction Less Trial Material Cylindrical Surrounding-Gate MOSFETs\",\"authors\":\"Lagraf , F., Rechem , D., Guergouri , K.\",\"doi\":\"10.12816/0056116\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":16506,\"journal\":{\"name\":\"Journal of New Technology and Materials\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":0.8000,\"publicationDate\":\"2019-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of New Technology and Materials\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.12816/0056116\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of New Technology and Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.12816/0056116","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}