热退火对氧化铟锡纳米包覆光纤传感器传感性能的影响

IF 0.5 Q4 OPTICS
B. Michalak, P. Sezemský, V. Stranak, M. Śmietana
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引用次数: 0

摘要

在这项工作中,我们讨论了热退火对沉积在多模聚合物包层二氧化硅(PCS)光纤芯上的氧化铟锡(ITO)薄膜的光学和电学性能的影响。使用不同配置的高功率脉冲磁控溅射(HiPIMS)和射频磁控溅射(RFMS)阴极沉积ITO膜。由于调节了ITO膜的厚度,可以观察到这些结构的损耗模式共振(LMR)和膜性质的痕量变化。还测量了ITO覆盖层的电阻。在管式炉和氮气气氛中于200°C退火后,重复进行光学和电学测量。测量结果表明,热退火改变了光纤传感器对外部折射率(RI)的光学响应,也改变了ITO层的电阻率。作为热退火的影响,我们观察到LMR向更长波长的移动。另外,作为退火的结果,ITO层的电阻率降低。全文:PDF参考文献M.Sobaszek等人,“ITO涂层有损模式共振传感器表面薄膜电聚合的光学监测”,Proc。SPIE,第10323卷,第103234W页,2017年。CrossRef I.Del Villar等人,“通过在无衬垫多模光纤上沉积高折射率涂层产生损耗模式谐振”,J.Opt。,第12卷,第9期,第955032010页。CrossRef M.šmietana等人,“用ITO涂覆的损耗模式共振传感器同时进行光学和电化学无标记生物传感”,《生物传感器和生物电子学》,第154卷,第1120502020页。CrossRef P.Niedzialkowski等人,“氧化铟锡涂层损耗模式谐振光纤传感器的电化学性能”,传感器和致动器B:Chemical,第301卷,第12期,第1-10页,2019。CrossRef V.Stranak等人,“中频放电辅助对双高功率脉冲磁控溅射的影响”,《表面与涂层技术》,第206卷,编号11-12。第2801-2809页,2012年。CrossRef I.Del Villar等人,“基于损耗模式谐振的传感器的设计规则”,Appl。选择第51卷,第19期,第4298-4307页,2012年。交叉参考吴和邱,“退火对射频磁控溅射氧化铟锡薄膜电学和光学性能的影响”,应用。冲浪Sci。,第68卷,第4期,第497-5041993页。CrossRef M.Smietana等人,“用ITO基损耗模式谐振光纤传感器作为电极对电化学过程进行光学监测”,J.Light。Technol。,第36卷,第4期,第954-9602018页。CrossRef M.Šmietana等人,“使用氧化铟锡涂层光纤传感器进行光学和电化学组合分析的研究”,《电分析》,第31卷,第2期,第398-4041919页。CrossRef
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effect of thermal annealing on sensing properties of optical fiber sensors coated with indium tin oxide nano-overlays
In this work we discuss an effect of thermal annealing on optical and electrical properties of indium tin oxide (ITO) thin films deposited on a short section of multimode polymer-clad silica (PCS) optical fiber core. ITO films were deposited using different configuration of high power impulse magnetron sputtering (HiPIMS) and radio frequency magnetron sputtering (RF MS) cathodes. Due to tuned ITO film thickness it was possible to observe for these structures a lossy-mode resonance (LMR) and trace changes in properties of the films. Electrical resistance of the ITO overlays was also measured. Both optical and electrical measurements were repeated after annealing at 200°C in a tube furnace and nitrogen atmosphere. The measurements have shown that thermal annealing changes optical response to external refractive index (RI) of the fiber sensor and also changes the ITO layer resistivity. As an effect of thermal annealing we observed a shift of the LMR towards longer wavelengths. In addition as a result of annealing, the resistivity of the ITO layer was reduced. Full Text: PDF References M. Sobaszek et al., "Optical monitoring of thin film electro-polymerization on surface of ITO-coated lossy-mode resonance sensor", Proc. SPIE, vol. 10323, pp. 103234W, 2017. CrossRef I. Del Villar et al., " Generation of lossy mode resonances by deposition of high-refractive-index coatings on uncladded multimode optical fibers", J. Opt., vol. 12, no. 9, pp. 95503, 2010. CrossRef M. Śmietana et al., "Simultaneous optical and electrochemical label-free biosensing with ITO-coated lossy-mode resonance sensor", Biosensors and Bioelectronics, vol. 154, pp. 112050, 2020. CrossRef P. Niedzialkowski et al., " Electrochemical performance of indium-tin-oxide-coated lossy-mode resonance optical fiber sensor", Sensors and Actuators B: Chemical, vol. 301, no. 12, pp. 1-10, 2019. CrossRef V. Stranak et al., "Effect of mid-frequency discharge assistance on dual-high power impulse magnetron sputtering", Surface & Coatings Technology, vol. 206, no. 11-12. pp. 2801-2809, 2012. CrossRef I. Del Villar et al., "Design rules for lossy mode resonance based sensors", Appl. Opt., vol. 51, no. 19, pp. 4298-4307, 2012. CrossRef W. F. Wu and B. S. Chiou, "Effect of annealing on electrical and optical properties of RF magnetron sputtered indium tin oxide films", Appl. Surf. Sci., vol. 68, no. 4, pp. 497-504, 1993. CrossRef M. Smietana et al., "Optical Monitoring of Electrochemical Processes With ITO-Based Lossy-Mode Resonance Optical Fiber Sensor Applied as an Electrode", J. Light. Technol., vol. 36, no. 4, pp. 954-960, 2018. CrossRef M. Śmietana et al., "Study on Combined Optical and Electrochemical Analysis Using Indium‐tin‐oxide‐coated Optical Fiber Sensor", Electroanalysis, vol. 31, no.2, pp. 398-404, 2019. CrossRef
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