V. Karatayev, L. Rudstam, A. Karatayev, L. Burlakova, B. Adamovich, H. Zhukava, K. Holeck, A. Hetherington, J. Jackson, C. Balogh, Z. Serfőző, Christopher W. Hotaling, T. Zhukova, T. M. Mikheyeva, R. Z. Kovalevskaya, O. Makarevich, Darya V. Kruk
{"title":"单个和连续入侵下生态系统影响与恢复的时间尺度","authors":"V. Karatayev, L. Rudstam, A. Karatayev, L. Burlakova, B. Adamovich, H. Zhukava, K. Holeck, A. Hetherington, J. Jackson, C. Balogh, Z. Serfőző, Christopher W. Hotaling, T. Zhukova, T. M. Mikheyeva, R. Z. Kovalevskaya, O. Makarevich, Darya V. Kruk","doi":"10.1007/s10021-023-00828-2","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":null,"pages":null},"PeriodicalIF":4.3000,"publicationDate":"2023-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Time Scales of Ecosystem Impacts and Recovery Under Individual and Serial Invasions\",\"authors\":\"V. Karatayev, L. Rudstam, A. Karatayev, L. Burlakova, B. Adamovich, H. Zhukava, K. Holeck, A. Hetherington, J. Jackson, C. Balogh, Z. Serfőző, Christopher W. Hotaling, T. Zhukova, T. M. Mikheyeva, R. Z. Kovalevskaya, O. Makarevich, Darya V. Kruk\",\"doi\":\"10.1007/s10021-023-00828-2\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":3,\"journal\":{\"name\":\"ACS Applied Electronic Materials\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2023-03-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Electronic Materials\",\"FirstCategoryId\":\"93\",\"ListUrlMain\":\"https://doi.org/10.1007/s10021-023-00828-2\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"93","ListUrlMain":"https://doi.org/10.1007/s10021-023-00828-2","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}