纳米尺度地质材料的三维电子层析分析

IF 3.4 2区化学 Q1 SPECTROSCOPY

Atomic Spectroscopy Pub Date : 2022-02-17 DOI:10.46770/as.2022.012

Jianxi Zhu

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引用次数: 0

摘要

：电子断层扫描（ET）是一种基于电子显微镜的技术，通过倾斜的二维（2D）投影提供三维（3D）结构信息，促进了结构生物学中生物分子的深入研究和物理科学中原子尺度上材料结构的分析。尽管ET作为一种通过使用先进的透射电子显微镜系统实现原子级分辨率的有效技术发展迅速，但它尚未被地球和行星科学界广泛使用。在此，我们验证了ET在地球和行星科学相关研究中的适用性。数据表明，ET可以用于观测矿物颗粒的三维形态以及地球和行星材料化学成分的三维分布。值得注意的是，ET与光谱学（包括电子能量损失光谱学和能量色散光谱学）相结合，是研究三维分布的有效技术

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Three-Dimensional Analyses Of Geological Materials On Nanoscale By Electron Tomography

: Electron tomography (ET), an electron-microscopy-based technique that provides three-dimensional (3D) structural information from a tilt series of two-dimensional (2D) projections, has promoted the in-depth investigation of biological molecules in structural biology and the analysis of material structures on the atomic scale in physical sciences. Although ET has developed rapidly as an effective technique wherein atomic-scale resolution has been achieved by using advanced transmission electron microscopy systems, it has not been widely used by the earth and planetary science community. Herein, we verify the applicability of ET in research related to earth and planetary science. The data demonstrate that ET can be used to observe the 3D morphology of mineral grains and 3D distributions of the chemical components of earth and planetary materials. Notably, ET coupled with spectroscopy, including electron energy loss spectroscopy and energy dispersive spectroscopy, is an effective technique for studying the 3D distribution

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来源期刊

Atomic Spectroscopy 物理-光谱学

CiteScore

5.30

自引率

14.70%

发文量

审稿时长

4.5 months

期刊介绍： The ATOMIC SPECTROSCOPY is a peer-reviewed international journal started in 1962 by Dr. Walter Slavin and now is published by Atomic Spectroscopy Press Limited (ASPL). It is intended for the rapid publication of both original articles and review articles in the fields of AAS, AFS, ICP-OES, ICP-MS, GD-MS, TIMS, SIMS, AMS, LIBS, XRF and related techniques. Manuscripts dealing with (i) instrumentation & fundamentals, (ii) methodology development & applications, and (iii) standard reference materials (SRMs) development can be submitted for publication.