掺锌MnO纳米复合材料薄膜光学性能的改进

A. Saleh
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引用次数: 0

摘要

通过化学喷雾热解(CSP)工艺在玻璃衬底上沉积了MnO、Mn:5%ZnO和Mn:10%ZnO的纳米结构薄膜。为了检测薄膜的结构和光学特性,采用了XRD、FE-SEM和UV-VIS分光光度计等多种分析技术对合成的薄膜进行了表征。X射线衍射表明,沉积条件影响了这些薄膜中的晶粒尺寸,Scherrer方程表明,ZnO掺杂的锰溶液使平均晶粒尺寸增加。线性图显示,除了Mn:5%ZnO具有负斜率(-0.0013)外,所有样品的MnO和Mn:10%ZnO在纳米四方样品中具有拉伸应变和晶格膨胀,均具有正斜率(0.0004和0.001)。FE-SEM图像显示,对于MnO、Mn:5%ZnO和Mn:10%ZnO纳米结构薄膜,所有样品粒径分别为35.7、56.9和23.6nm,其与XRD分析相匹配。在可见光谱的范围内,最佳平均透射值在20%和60%之间。Tauc关系用于确定光学能带隙(Eg),其在ZnO掺杂时表现出从2.93eV增加到3.11eV。Mn:ZnO薄膜显示出对各种应用至关重要的多功能光学特性,包括透明电磁干扰(EMI)屏蔽材料、光伏和太阳能电池。Mn:5%ZnO样品产生3.06eV的光学带隙,这低于在纯ZnO膜中观察到的3.37eV的光带隙。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Improvement of the Optical Properties of Zn-Doped MnO Nanocomposites Thin films
Nanostructured thin films of MnO, Mn:5%ZnO, and Mn:10%ZnO were deposited through the process of chemical spray pyrolysis (CSP) on glass substrates. To examine the structural and optical characteristics, various analytical techniques such as XRD, FE-SEM, and UV-VIS spectrophotometer were employed to characterize the thin films that were synthesized. X-ray diffraction demonstrated that deposition conditions affected crystallite size in these thin films, and the Scherrer equation showed that the average crystalline size increased with ZnO-doped manganese solution. The linear plot shows a positive slope (0.0004 and 0.001) for all samples MnO and Mn:10%ZnO, which have a tensile strain and a lattice expansion in nano-tetragonal samples, except for Mn:5%ZnO, which has a negative slope (-0.0013). FE-SEM images showed that the particle size for all samples was 35.7, 56.9, and 23.6 nm for MnO, Mn:5%ZnO, and Mn:10%ZnO nanostructured thin films, respectively, which matches XRD analyses. Within the range of the visible spectrum, the optimal average transmission value falls between 20% and 60%. The Tauc relation was used to determine the optical energy-band gap (Eg), which exhibited an increase from 2.93 eV to 3.11 eV upon ZnO doping. The Mn: ZnO thin films show versatile optical properties that are essential for various applications, including transparent electromagnetic interference (EMI) shielding materials, photovoltaic, and solar cells. The Mn:5%ZnO sample produced an optical band gap of 3.06 eV, which was lower than the optical band gap of 3.37 eV observed in pure ZnO films.
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