A. A. Harnawan, Mawar Resty Anggraini, Iwan Sugriwan
{"title":"干燥橡胶水平的决定型(K3)乳胶(Hevea Brasiliensis)采用一种基于微处理器ATMega8535的kapastion方法","authors":"A. A. Harnawan, Mawar Resty Anggraini, Iwan Sugriwan","doi":"10.20527/FLUX.V1I1.6151","DOIUrl":null,"url":null,"abstract":"The latex K3 determinant prototype using the ATMEGA8535 microcontroller based capacitive method was completed . K3 measuring system is arranged in several systems, there are parallel plate capacitive sensors, multivibrator, frequency to voltage converter, non inverting amplifier, ATMega8535 microcontroller module and 16x2 character LCD. The value of the latex capacitance is converted into a frequency by a multivibrator, then the frequency is converted to voltage and connected to the microcontroller to be processed and displayed the K3 value of latex on the LCD. The voltage characterization processes with a K3 value produces a K3 characteristic equation = - 19.996v + 54,831. These equations are processed in the BASCOM AVR program which is embedded in the microcontroller. The determination of K3 is used capacitive sensor which functions to read changes in the dielectric constant of latex , which has dimensions of 2.5 x 2.5cm with a distance between pieces of 0.6cm. In testing, the prototype can determine the value of K3 from 18% to 28% and the difference in K3 values from 0.3% to 1.2% compared to industrial measurements.","PeriodicalId":34112,"journal":{"name":"Jurnal Fisika Flux","volume":" ","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2019-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Prototipe Penentu Kadar Karet Kering (K3) Lateks (Hevea Brasiliensis) Menggunakan Metode Kapasitif Berbasis Mikrokontroler ATMega8535\",\"authors\":\"A. A. Harnawan, Mawar Resty Anggraini, Iwan Sugriwan\",\"doi\":\"10.20527/FLUX.V1I1.6151\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The latex K3 determinant prototype using the ATMEGA8535 microcontroller based capacitive method was completed . K3 measuring system is arranged in several systems, there are parallel plate capacitive sensors, multivibrator, frequency to voltage converter, non inverting amplifier, ATMega8535 microcontroller module and 16x2 character LCD. The value of the latex capacitance is converted into a frequency by a multivibrator, then the frequency is converted to voltage and connected to the microcontroller to be processed and displayed the K3 value of latex on the LCD. The voltage characterization processes with a K3 value produces a K3 characteristic equation = - 19.996v + 54,831. These equations are processed in the BASCOM AVR program which is embedded in the microcontroller. The determination of K3 is used capacitive sensor which functions to read changes in the dielectric constant of latex , which has dimensions of 2.5 x 2.5cm with a distance between pieces of 0.6cm. In testing, the prototype can determine the value of K3 from 18% to 28% and the difference in K3 values from 0.3% to 1.2% compared to industrial measurements.\",\"PeriodicalId\":34112,\"journal\":{\"name\":\"Jurnal Fisika Flux\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-01-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Jurnal Fisika Flux\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.20527/FLUX.V1I1.6151\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Jurnal Fisika Flux","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.20527/FLUX.V1I1.6151","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
利用ATMEGA8535单片机完成了基于电容法的乳胶K3行列式样机。K3测量系统布置在多个系统中,有并联板电容式传感器、多谐振荡器、频压变换器、非反相放大器、ATMega8535单片机模块和16x2字符液晶显示屏。通过多振器将乳胶电容值转换成频率,然后将频率转换成电压并连接到单片机进行处理,并在LCD上显示乳胶的K3值。K3值的电压表征过程产生K3特征方程= - 19.996v + 54,831。这些方程在嵌入在微控制器中的BASCOM AVR程序中进行处理。K3的测定采用电容式传感器,该传感器的功能是读取乳胶介电常数的变化,其尺寸为2.5 x 2.5cm,片间距离为0.6cm。在测试中,与工业测量相比,原型机可以确定K3的值从18%到28%,K3值的差异从0.3%到1.2%。
Prototipe Penentu Kadar Karet Kering (K3) Lateks (Hevea Brasiliensis) Menggunakan Metode Kapasitif Berbasis Mikrokontroler ATMega8535
The latex K3 determinant prototype using the ATMEGA8535 microcontroller based capacitive method was completed . K3 measuring system is arranged in several systems, there are parallel plate capacitive sensors, multivibrator, frequency to voltage converter, non inverting amplifier, ATMega8535 microcontroller module and 16x2 character LCD. The value of the latex capacitance is converted into a frequency by a multivibrator, then the frequency is converted to voltage and connected to the microcontroller to be processed and displayed the K3 value of latex on the LCD. The voltage characterization processes with a K3 value produces a K3 characteristic equation = - 19.996v + 54,831. These equations are processed in the BASCOM AVR program which is embedded in the microcontroller. The determination of K3 is used capacitive sensor which functions to read changes in the dielectric constant of latex , which has dimensions of 2.5 x 2.5cm with a distance between pieces of 0.6cm. In testing, the prototype can determine the value of K3 from 18% to 28% and the difference in K3 values from 0.3% to 1.2% compared to industrial measurements.