碳化硅中碳空位缺陷性质的密度泛函理论计算

Xiuhong Wang , Junlei Zhao , Zongwei Xu , Flyura Djurabekova , Mathias Rommel , Ying Song , Fengzhou Fang
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引用次数: 6

摘要

碳化硅作为一种极具潜力的量子技术材料,引起了材料科学领域的广泛关注。碳空位是4H-SiC的主要缺陷。因此,了解这种缺陷的性质对其应用至关重要,并且需要识别缺陷的原子和电子结构。在本研究中,密度泛函理论被用于表征碳空位缺陷在六方(h)和立方(k)晶格位置。采用标准Perdew-Burke-Ernzerhof和Heyd-Scuseria-Ernzerhof方法计算了不同超电池(72,128,400和576个原子)中不同电荷态(2−,−,0,+和2+)的碳空位的零声子线能、超精细张量和形成能。结果表明,碳空位缺陷的零声子线能量远低于空位缺陷的零声子线能量,表明前者比后者更容易达到激发态。计算了VC+(h)和VC+(k)的超精细张量。计算得到的超精细张量与实验结果的比较表明,碳化硅晶格中存在碳空位。生成能计算表明,随着电子化学势的增大,材料中最稳定的碳空位缺陷为VC2+(k)、VC+(k)、VC(k)、VC−(k)和VC2−(k)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Density functional theory calculation of the properties of carbon vacancy defects in silicon carbide

As a promising material for quantum technology, silicon carbide (SiC) has attracted great interest in materials science. Carbon vacancy is a dominant defect in 4H-SiC. Thus, understanding the properties of this defect is critical to its application, and the atomic and electronic structures of the defects needs to be identified. In this study, density functional theory was used to characterize the carbon vacancy defects in hexagonal (h) and cubic (k) lattice sites. The zero-phonon line energies, hyperfine tensors, and formation energies of carbon vacancies with different charge states (2, , 0, + and 2+) in different supercells (72, 128, 400 and 576 atoms) were calculated using standard Perdew–Burke–Ernzerhof and Heyd–Scuseria–Ernzerhof methods. Results show that the zero-phonon line energies of carbon vacancy defects are much lower than those of divacancy defects, indicating that the former is more likely to reach the excited state than the latter. The hyperfine tensors of VC+(h) and VC+(k) were calculated. Comparison of the calculated hyperfine tensor with the experimental results indicates the existence of carbon vacancies in SiC lattice. The calculation of formation energy shows that the most stable carbon vacancy defects in the material are VC2+(k), VC+(k), VC(k), VC(k) and VC2−(k) as the electronic chemical potential increases.

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