CMOS的偏置和降噪技术综述

Q4 Engineering
Carlos Alberto Dos Reis
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引用次数: 2

摘要

输入参考偏移电压、1/f噪声和热噪声是放大器特性,它们直接限制识别信号的能力超过某个极限。集成电路的应用范围和半导体市场的趋势不断扩大,促使工程师设计出具有连续更低电压、更低功耗、更高动态范围、精确增益和更宽带宽的电路,最好是一起设计。放大器输入误差是关键特性,必须将其最小化,但对其他同等重要特性的负面影响最小。本文综述了一些用于减少CMOS放大器输入误差的最相关技术,旨在提供一组浓缩的信息,帮助设计者在新的精密模拟电路设计起点上进行设计。在本次审查工作中选择研究的所有情况下,重点都是减少偏移和噪声,无论所使用的技术是否具有放大器的其他特性及其对NEF和PEF等品质因数的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Review of Offset and Noise Reduction Techniques for CMOS
Input referred offset voltage, 1/f noise and thermal noise are amplifier properties that directly restrict the ability of discerning signals beyond a certain limit. The ever increasing spectrum of applications of integrated circuits and trends in the semiconductor market have pushed engineers to design circuits with successively lower voltage, less power consumption, higher dynamic range, accurate gain and wider bandwidth, preferably altogether. Amplifiers input errors are key properties, which have to be minimized, however with the least negative impact upon the other equally important properties. This paper reviews some the most relevant techniques applied to reducing input errors of CMOS amplifiers aiming at to provide a condensed set of information that can help designers at the starting point of a new design of a precision analog circuit. The focus in all cases that were selected to be studied in this review work was the reduction of offset and noise regardless of any commitment of the used technique with other characteristics of the amplifier and its impacts on figures of merit like NEF and PEF. 
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来源期刊
Journal of Integrated Circuits and Systems
Journal of Integrated Circuits and Systems Engineering-Electrical and Electronic Engineering
CiteScore
0.90
自引率
0.00%
发文量
39
期刊介绍: This journal will present state-of-art papers on Integrated Circuits and Systems. It is an effort of both Brazilian Microelectronics Society - SBMicro and Brazilian Computer Society - SBC to create a new scientific journal covering Process and Materials, Device and Characterization, Design, Test and CAD of Integrated Circuits and Systems. The Journal of Integrated Circuits and Systems is published through Special Issues on subjects to be defined by the Editorial Board. Special issues will publish selected papers from both Brazilian Societies annual conferences, SBCCI - Symposium on Integrated Circuits and Systems and SBMicro - Symposium on Microelectronics Technology and Devices.
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