卡塔尔沙漠气候条件下光伏组件的目视和红外检测分析

Q4 Physics and Astronomy
K. Ali, A. Abdallah, M. Kivambe, J. Zaini, M. M. Nauman
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引用次数: 0

摘要

本研究介绍了安装在卡塔尔环境和能源研究所(QEERI)室外测试设施(OTF)的光伏(PV)技术的视觉和红外(IR)检测结果。硅基光伏技术自2014年以来一直在现场运行,研究了各种失效模式。从背面对所有光伏组件进行了目视检查,但由于严重污染,无法从正面对某些组件进行检查。在本次研究中发现的视觉缺陷包括:背面玻璃开裂,密封剂材料发黄,背面板形成裂纹,背面板形成凹坑。目视检查显示,大约19%的模块背面有裂缝和变色,8%的封装剂发黄,约4%的背板有凹坑。此外,其中一个模块检测到背面玻璃开裂。对所有硅光伏组件的正面和背面也进行了红外检查,以检测热点。红外检测显示,在光伏组件的不同位置产生了热点。39%的模块在接线盒位置有热点,约6%的模块在接线盒位置有热点,约1%的模块在远离接线盒的位置有热点。目视和红外检测表明,在OTF上观察到的硅基技术的主要失效模式是接线盒上产生的热点和后片的开裂以及变黄。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Visual and IR Inspection Analysis of PV Modules Installed at the Desert Climate of Qatar
This study presents the results of visual and infrared (IR) inspection of photovoltaics (PV) technologies installed at the Qatar environment and energy research institute (QEERI) outdoor test facility (OTF) at Qatar Foundation (Doha, Qatar). Silicon based PV technologies which have been operational in the field since 2014, have been investigated for various failure modes. The visual inspections were carried out for all the PV modules from the backside however, the inspection from the front side was not possible for some modules due to heavy soiling. The visual defects which were identified during this study include, cracking of the back glass, yellowing of the encapsulant material, cracks formation in the back sheet, and pits formation in the back sheet. The visual inspection revealed that around 19 % of the total modules have back sheet cracking and discoloration, 8 % have yellowing of the encapsulant, and around 4 % were having pits in the back sheet. Moreover, one module was detected with back glass cracking. The IR inspection was also done both from front and backside for all the silicon PV modules to detect hot spots. The IR inspection has revealed that hot spots were generated at different locations of the PV modules. 39 % of the modules have hot spots at the location of junction boxes, around 6 % of the modules have hot spots in junction boxes and around 1 % have hot spots at the locations away from junction boxes. The visual and IR inspection has revealed that the dominant failure modes which have been observed for silicon-based technologies at OTF are the hot spots generation at junction boxes and the back sheet cracking, and its yellowing.
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来源期刊
Defect and Diffusion Forum
Defect and Diffusion Forum Physics and Astronomy-Radiation
CiteScore
1.20
自引率
0.00%
发文量
127
期刊介绍: Defect and Diffusion Forum (formerly Part A of ''''Diffusion and Defect Data'''') is designed for publication of up-to-date scientific research and applied aspects in the area of formation and dissemination of defects in solid materials, including the phenomena of diffusion. In addition to the traditional topic of mass diffusion, the journal is open to papers from the area of heat transfer in solids, liquids and gases, materials and substances. All papers are peer-reviewed and edited. Members of Editorial Boards and Associate Editors are invited to submit papers for publication in “Defect and Diffusion Forum” . Authors retain the right to publish an extended and significantly updated version in another periodical.
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