用Thomas-Fermi方法模拟任意掺杂n-Si中量子线的电子能谱

V. Grimalsky, S. Koshevaya, J. Escobedo-Alatorre, I. Moroz
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引用次数: 0

摘要

采用托马斯费米(TF)方法计算了有限温度下掺杂n-Si量子线中的电子光谱。多个身体交换校正被考虑在内。掺杂分布是任意的。在第一阶段,电子势能是从一个简单的二维方程中计算出来的。提出了一种有效的迭代方案,该方案对多维问题有效。然后用薛定谔方程模拟了量子阱的能级和波函数。使用线性谐振子的全组本征函数的展开。量子力学微扰理论可以用来计算能级。一般来说,应该使用简并能级的微扰理论。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Simulations of the Electron Spectrum of Quantum Wires in n-Si of Arbitrarily Doping Profile by Thomas-Fermi Method
Electron spectrum in doped n-Si quantum wires is calculated by the Thomas-Fermi (TF) method under finite temperatures. The many-body exchange corrections are taken into account. The doping profile is arbitrary. At the first stage, the electron potential energy is calculated from a simple two-dimensional equation. The effective iteration scheme is proposed there that is valid for multidimensional problems. Then the energy levels and wave functions of this quantum well are simulated from the Schrodinger equations. The expansion by the full set of eigenfunctions of the linear harmonic oscillator is used. The quantum mechanical perturbation theory can be utilized to compute the energy levels. Generally, the perturbation theory for degenerate energy levels should be used.
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