基于智能制造的电子装配核心产业制造过程

IF 2.5 Q2 COMPUTER SCIENCE, INFORMATION SYSTEMS
Rongli Chen, Xiaozhong Chen, Lei Wang, Jian-Xin Li
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引用次数: 1

摘要

本研究采用个案研究的方法,以显示不同于核心制造业流程的多元化采用和产品策略的发展。以陶瓷电路板制造和电子组装为例,阐述了智能制造各方面的发展现状,并概述了未来智能制造的计划和流程。该研究提出了两个实验,分别利用人工智能和深度学习来展示制造方法和工厂设施方面的问题和解决方案。在第一个实验中,利用贝叶斯网络推理,通过关键工艺和质量的相关性,找到电子电路之间金属残留问题的原因。在第二个实验中,使用卷积神经网络来识别自动光学检测过程中过度检测的假缺陷。这通过提高成品率和降低成本来改善制造过程。本研究的贡献建立在电路板生产上。智能制造通过将贝叶斯网络应用于物联网设置,解决了陶瓷电路板图案边缘残留和冗余导体的问题,改善和防止了漏电和高频干扰。利用卷积神经网络和深度学习技术,提高光学自动检测系统的准确率,降低目前人工复核率,节约人工成本,并为预处理改进提供缺陷分类参考。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The Core Industry Manufacturing Process of Electronics Assembly Based on Smart Manufacturing
This research takes a case study approach to show the development of a diverse adoption and product strategy distinct from the core manufacturing industry process. It explains the development status in all aspects of smart manufacturing, via the example of ceramic circuit board manufacturing and electronic assembly, and outlines future smart manufacturing plans and processes. The research proposed two experiments using artificial intelligence and deep learning to demonstrate the problems and solutions regarding methods in manufacturing and factory facilities, respectively. In the first experiment, a Bayesian network inference is used to find the cause of the problem of metal residues between electronic circuits through key process and quality correlations. In the second experiment, a convolutional neural network is used to identify false defects that were overinspected during automatic optical inspection. This improves the manufacturing process by enhancing the yield rate and reducing cost. The contributions of the study built in circuit board production. Smart manufacturing, with the application of a Bayesian network to an Internet of Things setup, has addressed the problem of residue and redundant conductors on the edge of the ceramic circuit board pattern, and has improved and prevented leakage and high-frequency interference. The convolutional neural network and deep learning were used to improve the accuracy of the automatic optical inspection system, reduce the current manual review ratio, save labor costs, and provide defect classification as a reference for preprocess improvement.
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来源期刊
ACM Transactions on Management Information Systems
ACM Transactions on Management Information Systems COMPUTER SCIENCE, INFORMATION SYSTEMS-
CiteScore
6.30
自引率
20.00%
发文量
60
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