嵌入式系统故障诊断的多层体系结构

IF 1.4 Q2 ENGINEERING, MULTIDISCIPLINARY
Daniel Maas, Renan Sebem, André Bittencourt Leal
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引用次数: 0

摘要

本文提出了一种基于离散事件系统(DES)形式化建模的嵌入式系统故障诊断多层体系结构。在工业生产中,执行器是磨损较大的设备,目前对其诊断的研究大多集中在执行器故障上。然而,嵌入式系统普遍受到成本降低的影响,这可能会增加电子硬件故障的概率。此外,软件故障难以跟踪和修复,常见的解决方案是更换整个电路板。我们提出了一种建模方法,其中包括模型中故障源的隔离,涉及嵌入式系统的三层:软件,硬件,传感器和执行器。将该方法应用于某家电冰箱,经过强制故障的详尽实际测试,对所有故障进行了诊断,准确地识别出了故障层和故障部件。然后将该解决方案纳入工业规模生产的产品中。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Multilayer Architecture for Fault Diagnosis of Embedded Systems
This work presents a multilayer architecture for fault diagnosis in embedded systems based on formal modeling of Discrete Event Systems (DES). Most works on diagnosis of DES focus in faults of actuators, which are the devices subject to intensive wear in industry. However, embedded systems are commonly subject to cost reduction, which may increase the probability of faults in the electronic hardware. Further, software faults are hard to track and fix, and the common solution is to replace the whole electronic board. We propose a modeling approach which includes the isolation of the source of the fault in the model, regarding three layers of embedded systems: software, hardware, and sensors & actuators. The proposed method is applied to a home appliance refrigerator and after exhaustive practical tests with forced fault occurrences, all faults were diagnosed, precisely identifying the layer and the faulty component. The solution was then incorporated into the product manufactured in industrial scale.
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来源期刊
CiteScore
2.90
自引率
9.50%
发文量
18
审稿时长
9 weeks
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