{"title":"基体挥发ICP-OES和ICP-MS用于高纯碲材料中微量元素分析","authors":"N. S. Medvedev","doi":"10.46770/as.2022.248","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":8642,"journal":{"name":"Atomic Spectroscopy","volume":null,"pages":null},"PeriodicalIF":3.4000,"publicationDate":"2022-03-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Matrix Volatilization ICP-OES And ICP-MS For Trace Elements Analysis In High-Purity Tellurium Materials\",\"authors\":\"N. S. Medvedev\",\"doi\":\"10.46770/as.2022.248\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":8642,\"journal\":{\"name\":\"Atomic Spectroscopy\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":3.4000,\"publicationDate\":\"2022-03-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Atomic Spectroscopy\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://doi.org/10.46770/as.2022.248\",\"RegionNum\":2,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"SPECTROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Atomic Spectroscopy","FirstCategoryId":"92","ListUrlMain":"https://doi.org/10.46770/as.2022.248","RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"SPECTROSCOPY","Score":null,"Total":0}
期刊介绍:
The ATOMIC SPECTROSCOPY is a peer-reviewed international journal started in 1962 by Dr. Walter Slavin and now is published by Atomic Spectroscopy Press Limited (ASPL). It is intended for the rapid publication of both original articles and review articles in the fields of AAS, AFS, ICP-OES, ICP-MS, GD-MS, TIMS, SIMS, AMS, LIBS, XRF and related techniques. Manuscripts dealing with (i) instrumentation & fundamentals, (ii) methodology development & applications, and (iii) standard reference materials (SRMs) development can be submitted for publication.