基于reram的交叉棒存储系统的感测放大器

Q3 Engineering
Hock Leong Chee, Yufeng Kok, T. N. Kumar, Haider A. F. Almurib
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引用次数: 3

摘要

提出了一种用于电阻式随机存取存储器(ReRAM)存储阵列的电压模式检测放大电路。感测放大器由一个反相缓冲器组成,因此它可以在非常低的电压(150 mV)下工作,这是ReRAM单元的典型READ输出电压,而所提出的差分比较器设计与传统设计相比,利用减少的晶体管数量(20%)来确定ReRAM单元的逻辑状态。利用2 × 2存储交叉棒进行了仿真,并与现有的电压模式和电流模式检测放大器进行了比较,所提出的电路比现有方法具有更好的读时间(32%和85%)和能量性能(54%和59%)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Sense amplifier for ReRAM-based crossbar memory systems
ABSTRACT A voltage-mode sense amplifier circuit designed for resistive random-access memory (ReRAM)-based memory arrays is proposed. The sense amplifier is designed comprising of an inverting buffer so that it can operate at a very low voltage (150 mV), which is the typical READ output voltages of a ReRAM cell while the proposed differential comparator design utilises a reduced number of transistors (20%) compared with conventional design to determine the logic states of the ReRAM cell. A simulation with a 2 × 2 memory crossbar is performed and compared with existing voltage-mode and current-mode sense amplifiers and the proposed circuit shows better READ time (32% and 85%) and energy performance (54% and 59%) than existing methods.
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来源期刊
International Journal of Electronics Letters
International Journal of Electronics Letters Engineering-Electrical and Electronic Engineering
CiteScore
1.80
自引率
0.00%
发文量
42
期刊介绍: International Journal of Electronics Letters (IJEL) is a world-leading journal dedicated to the rapid dissemination of new concepts and developments across the broad and interdisciplinary field of electronics. The Journal welcomes submissions on all topics in electronics, with specific emphasis on the following areas: • power electronics • embedded systems • semiconductor devices • analogue circuits • digital electronics • microwave and millimetre-wave techniques • wireless and optical communications • sensors • instrumentation • medical electronics Papers should focus on technical applications and developing research at the cutting edge of the discipline. Proposals for special issues are encouraged, and should be discussed with the Editor-in-Chief.
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