用于多波段GSM应用的高性能锁相环

Q4 Engineering
U. Nanda, D. P. Acharya, D. Nayak, P. Rout
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引用次数: 2

摘要

死区经常成为高性能锁相环(PLL)的限制。提出了一种具有快速锁定和低相位噪声能力的无死区PLL的设计。这是通过在相位频率检测器(PFD)的反馈路径或复位路径中使用电压可变延迟元件(VVDE)来实现的。来自电荷泵电路的一个输入的反馈用于保持总体PFD延迟略为正,以在较小的相位噪声下逃离死区。在节奏设计环境中分析了该PFD的PLL性能。它在1 MHz偏移频率下实现了–110.5 dBc/Hz的相位噪声,与其他两种报道的技术相比,这是优越的。实现这种卓越的相位噪声性能,PLL以5%的额外物理面积为代价,消耗2.56mW的较小功率。该性能还与PLL的性能进行了比较,在PLL中不使用延迟和固定延迟元件来减少死区。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High performance PLL for multiband GSM applications
Dead zone very often poses to be a limitation in the high performance phase locked loops (PLLs). The design of a dead zone free PLL with fast locking and low phase noise capability is proposed. This is achieved by using a voltage variable delay element (VVDE) in the feedback path or reset path of the phase frequency detector (PFD). A feedback from one of the inputs of charge pump circuit is used to retain the overall PFD delay slightly positive to escape dead zone at lesser phase noise. The PLL performance with this proposed PFD is analysed in the cadence design environment. It attains phase noise of –110.5 dBc/Hz at 1 MHz offset frequency which is superior as compared to the other two reported techniques. Achieving this superior phase noise performance the PLL consumes lesser power of 2.56 mW at the cost of 5% extra physical area. This performance is also compared with that of PLL where no delay and fixed delay element is used to reduce the dead zone.
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来源期刊
International Journal of Nanoparticles
International Journal of Nanoparticles Engineering-Mechanical Engineering
CiteScore
1.60
自引率
0.00%
发文量
15
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