关于使用体内二极管剂量法来验证放射治疗期间递送剂量的见解

Jamal M. AL-Shareef, R. Elgebaly, E. Attalla, N. Deiab, Dalal Aqmar, Mohamed Fathy
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引用次数: 0

摘要

体内剂量测定(IVD)是确定治疗期间提供给患者的剂量的最准确方法之一。这项工作的目的是验证患者是否接受了准确的处方剂量。这是通过使用体内二极管剂量测定法(IVDD)评估由人为或设备故障引起的剂量传递错误而发生的。共对80例患者进行302场手术,包括骨盆、腹部、胸部和头颈部(h&n)患者。在临床应用之前,使用Alderson Rando幻影来评估二极管的可靠性,作为验证过程的补充。结果显示,该幻影的测量剂量在计划剂量的±5%以内。此外,达到测量剂量的91.4%的患者剂量在计划剂量的±5%以内。在其余8.6%中,约5.6%的测量剂量大于计划剂量的5%和小于10%,只有3%的测量剂量大于计划剂量的10%。超过5%的离群值在假体上重复进行体外测量,偏差在±5%以内。本研究表明,二极管测量在处理过程中提供了一个即时的读数,它是可靠的质量保证直线加速器。此外,IVDD能够检测主要和常见的治疗错误,如患者设置错误和不正确的源表面距离。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An insight on using in-vivo diode dosimetry to verify the delivered ‎doses during radiotherapy
In-vivo dosimetry (IVD) is one of the most accurate ways for determining the dosage provided to the patient during treatment . The aim of this work is to verify whether patients were receiving the accurate prescribed dose. Which occurs by assessing the dose delivery errors, caused by human or equipment malfunctioning, using in-vivo diode dosimetry (IVDD). In total, 302 fields were performed for 80 cases, including pelvis, abdomen, thorax, and head and neck (H & N) patients. Prior to the clinical application, Alderson Rando phantom was used to evaluate the diodes' dependability as a complement to the validation process. The results revealed that the measured dose of the phantom was within ±5% of the planned dose. Additionally, patients' doses achieved 91.4% of the measured dose were within ±5% of the planned dose. Of the other 8.6%, about 5.6 % of the measured doses were more than 5% and less than 10% and only 3% were larger than 10% of the planned dose. The outlying values that were more than 5% were repeated as in-vitro measurements on a phantom and the deviations were within ±5%. This study demonstrated that diode measurements provide an immediate readout during the treatment process and it is reliable as quality assurance for linear accelerator. Moreover, IVDD is capable of detecting major and common treatment errors such as patient setup errors and incorrect source surface distance.
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